Amir Zjajo

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
IC testing methods and apparatus
- Patent number 8,310,265
- Issue date Nov 13, 2012
- NXP B.V.
- Amir Zjajo
- G01 - MEASURING TESTING
Information Patent Grant
Analog circuit testing and test pattern generation
- Patent number 8,122,423
- Issue date Feb 21, 2012
- NXP B.V.
- Amir Zjajo
- G01 - MEASURING TESTING
Information Patent Grant
Analog IC having test arrangement and test method for such an IC
- Patent number 7,671,618
- Issue date Mar 2, 2010
- NXP B.V.
- Amir Zjajo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IC TESTING METHODS AND APPARATUS
- Publication number 20100127729
- Publication date May 27, 2010
- NXP B.V.
- Amir Zjajo
- G01 - MEASURING TESTING
Information Patent Application
ANALOG CIRCUIT TESTING AND TEST PATTERN GENERATION
- Publication number 20100109676
- Publication date May 6, 2010
- NXP, B.V.
- Amir Zjajo
- G01 - MEASURING TESTING
Information Patent Application
ANALOG IC HAVING TEST ARRANGEMENT AND TEST METHOD FOR SUCH AN IC
- Publication number 20090134904
- Publication date May 28, 2009
- NXP B.V.
- Amir Zjajo
- G01 - MEASURING TESTING