Amirhossein Nateghi

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Pasadena, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System for analyzing a test sample and method therefor
- Patent number 11,619,577
- Issue date Apr 4, 2023
- California Institute of Technology
- Axel Scherer
- G01 - MEASURING TESTING
Information Patent Grant
Cuvette having high optical transmissivity and method of forming
- Patent number 11,442,002
- Issue date Sep 13, 2022
- California Institute of Technology
- Axel Scherer
- G01 - MEASURING TESTING
Information Patent Grant
System for analyzing a test sample and method therefor
- Patent number 11,422,084
- Issue date Aug 23, 2022
- California Institute of Technology
- Axel Scherer
- G01 - MEASURING TESTING
Information Patent Grant
Cuvette having high optical transmissivity and method of forming
- Patent number 10,712,258
- Issue date Jul 14, 2020
- California Institute of Technology
- Axel Scherer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System for Optically Analyzing a Test Sample and Method Therefor
- Publication number 20230152211
- Publication date May 18, 2023
- California Institute of Technology
- Jack Jewell
- G01 - MEASURING TESTING
Information Patent Application
System for Analyzing a Test Sample and Method Therefor
- Publication number 20220349811
- Publication date Nov 3, 2022
- California Institute of Technology
- Axel Scherer
- G01 - MEASURING TESTING
Information Patent Application
Cuvette Having High Optical Transmissivity and Method of Forming
- Publication number 20200309676
- Publication date Oct 1, 2020
- California Institute of Technology
- Axel Scherer
- G01 - MEASURING TESTING
Information Patent Application
Cuvette Having High Optical Transmissivity and Method of Forming
- Publication number 20190170633
- Publication date Jun 6, 2019
- California Institute of Technology
- Axel Scherer
- G01 - MEASURING TESTING
Information Patent Application
System for Analyzing a Test Sample and Method Therefor
- Publication number 20190170637
- Publication date Jun 6, 2019
- California Institute of Technology
- Axel Scherer
- G01 - MEASURING TESTING