Amit BATIKOFF

Person

Petach Tikva, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Rendering-based lidar and camera alignment
- Patent number 11,568,565
- Issue date Jan 31, 2023
- GM Global Technology Operations LLC
- Doron Portnoy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 11,348,001
- Issue date May 31, 2022
- APPLIED MATERIAL ISRAEL, LTD.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 11,205,119
- Issue date Dec 21, 2021
- Applied Materials Israel Ltd.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 11,010,665
- Issue date May 18, 2021
- APPLIED MATERIAL ISRAEL, LTD.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting a specimen and system thereof
- Patent number 10,928,437
- Issue date Feb 23, 2021
- Applied Materials Israel Ltd.
- Zvi Goren
- G01 - MEASURING TESTING
Information Patent Grant
Registration between an image of an object and a description
- Patent number 10,902,620
- Issue date Jan 26, 2021
- Applied Materials Israel Ltd.
- Shaul Cohen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of performing metrology operations and system thereof
- Patent number 10,571,406
- Issue date Feb 25, 2020
- Applied Materials Israel Ltd.
- Ron Katzir
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a specimen and system thereof
- Patent number 10,545,490
- Issue date Jan 28, 2020
- Applied Materials Israel Ltd.
- Michele Dalla-Torre
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting a specimen and system thereof
- Patent number 10,444,274
- Issue date Oct 15, 2019
- Applied Materials Israel Ltd.
- Zvi Goren
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting defects in an object
- Patent number 10,430,938
- Issue date Oct 1, 2019
- Applied Materials Israel Ltd.
- Amit Batikoff
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of performing metrology operations and system thereof
- Patent number 10,296,702
- Issue date May 21, 2019
- Applied Materials Israel Ltd.
- Ron Katzir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of performing metrology operations and system thereof
- Patent number 10,120,973
- Issue date Nov 6, 2018
- Applied Materials Israel Ltd.
- Ron Katzir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting a specimen and system thereof
- Patent number 10,012,689
- Issue date Jul 3, 2018
- Applied Materials Israel Ltd.
- Zvi Goren
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a specimen and system thereof
- Patent number 9,851,714
- Issue date Dec 26, 2017
- Applied Materials Israel, Ltd.
- Michele Dalla-Torre
- G05 - CONTROLLING REGULATING
Information Patent Grant
System, method and computer program product for classification with...
- Patent number 9,098,893
- Issue date Aug 4, 2015
- Applied Materials Israel, Ltd.
- Michele Dalla-Torre
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computer program product for detection of defect...
- Patent number 8,977,035
- Issue date Mar 10, 2015
- Applied Materials Israel, Ltd.
- Michele Dalla-Torre
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ALIGNMENT VALIDATION IN VEHICLE-BASED SENSORS
- Publication number 20230134125
- Publication date May 4, 2023
- GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Michael Baltaxe
- B60 - VEHICLES IN GENERAL
Information Patent Application
RENDERING-BASED LIDAR AND CAMERA ALIGNMENT
- Publication number 20220414923
- Publication date Dec 29, 2022
- GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Doron Portnoy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...
- Publication number 20220067523
- Publication date Mar 3, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF
- Publication number 20200018789
- Publication date Jan 16, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Zvi GOREN
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PERFORMING METROLOGY OPERATIONS AND SYSTEM THEREOF
- Publication number 20190121933
- Publication date Apr 25, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Ron KATZIR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DETECTING DEFECTS IN AN OBJECT
- Publication number 20190026879
- Publication date Jan 24, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Amit BATIKOFF
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF
- Publication number 20180321299
- Publication date Nov 8, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Zvi GOREN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PERFORMING METROLOGY OPERATIONS AND SYSTEM THEREOF
- Publication number 20180268098
- Publication date Sep 20, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Ron KATZIR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PERFORMING METROLOGY OPERATIONS AND SYSTEM THEREOF
- Publication number 20180268099
- Publication date Sep 20, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Ron KATZIR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARNING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIM...
- Publication number 20170364798
- Publication date Dec 21, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...
- Publication number 20170357895
- Publication date Dec 14, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...
- Publication number 20170177997
- Publication date Jun 22, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF
- Publication number 20160349742
- Publication date Dec 1, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Michele DALLA-TORRE
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF
- Publication number 20160350905
- Publication date Dec 1, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Michele DALLA-TORRE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF
- Publication number 20160282404
- Publication date Sep 29, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Zvi GOREN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR CLASSIFICATION WITH...
- Publication number 20150310600
- Publication date Oct 29, 2015
- APPLIED MATERIALS ISRAEL LTD.
- Michele Dalla-Torre
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR DETECTION OF DEFECT...
- Publication number 20130336575
- Publication date Dec 19, 2013
- APPLIED MATERIALS ISRAEL LTD.
- Michele Dalla-Torre
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR CLASSIFICATION WITH...
- Publication number 20130163851
- Publication date Jun 27, 2013
- Michele Dalla-Torre
- G01 - MEASURING TESTING

Amit BATIKOFF

Person

Patents Grantslast 30 patents

Rendering-based lidar and camera alignment

Method of deep learning-based examination of a semiconductor specim...

Method of deep learning-based examination of a semiconductor specim...

Method of deep learning-based examination of a semiconductor specim...

Method of inspecting a specimen and system thereof

Registration between an image of an object and a description

Method of performing metrology operations and system thereof

Method of inspecting a specimen and system thereof

Method of inspecting a specimen and system thereof

Method of detecting defects in an object

Method of performing metrology operations and system thereof

Method of performing metrology operations and system thereof

Method of inspecting a specimen and system thereof

Method of inspecting a specimen and system thereof

System, method and computer program product for classification with...

System, method and computer program product for detection of defect...

Patents Applicationslast 30 patents

ALIGNMENT VALIDATION IN VEHICLE-BASED SENSORS

RENDERING-BASED LIDAR AND CAMERA ALIGNMENT

METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...

METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF

METHOD OF PERFORMING METROLOGY OPERATIONS AND SYSTEM THEREOF

METHOD OF DETECTING DEFECTS IN AN OBJECT

METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF

METHOD OF PERFORMING METROLOGY OPERATIONS AND SYSTEM THEREOF

METHOD OF PERFORMING METROLOGY OPERATIONS AND SYSTEM THEREOF

METHOD OF DEEP LEARNING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIM...

METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...

METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...

METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF

METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF

METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR CLASSIFICATION WITH...

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR DETECTION OF DEFECT...

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR CLASSIFICATION WITH...