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Amit Jindal
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Sonypat, IN
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Patents Grants
last 30 patents
Information
Patent Grant
Systems and methods for asymmetric memory access to memory banks wi...
Patent number
10,241,941
Issue date
Mar 26, 2019
NXP USA, INC.
Joachim Fader
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Memory access scheme for system on chip
Patent number
9,292,380
Issue date
Mar 22, 2016
Freescale Semiconductor,INC
Nitin Singh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for logic built-in self-test
Patent number
9,285,424
Issue date
Mar 15, 2016
Freescale Semiconductor,INC
Nitin Singh
G01 - MEASURING TESTING
Information
Patent Grant
System for testing error detection circuits
Patent number
8,868,989
Issue date
Oct 21, 2014
FREESCALE SEMICONDUCTOR, INC.
Amit Jindal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Data retention flip-flop
Patent number
8,841,952
Issue date
Sep 23, 2014
FREESCALE SEMICONDUCTOR, INC.
Nitin Singh
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
Design For Test For Source Synchronous Interfaces
Publication number
20240192271
Publication date
Jun 13, 2024
NXP B.V.
Akhil Garg
G01 - MEASURING TESTING
Information
Patent Application
Systems And Methods For Asymmetric Memory Access To Memory Banks Wi...
Publication number
20160378695
Publication date
Dec 29, 2016
FREESCALE SEMICONDUCTOR, INC.
Joachim Fader
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR LOGIC BUILT-IN SELF-TEST
Publication number
20160025808
Publication date
Jan 28, 2016
FREESCALE SEMICONDUCTOR, INC.
Nitin Singh
G01 - MEASURING TESTING
Information
Patent Application
MEMORY ACCESS SCHEME FOR SYSTEM ON CHIP
Publication number
20150286525
Publication date
Oct 8, 2015
FREESCALE SEMICONDUCTOR, INC.
Nitin Singh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM FOR TESTING ERROR DETECTION CIRCUITS
Publication number
20140019818
Publication date
Jan 16, 2014
Freescale Semiconductor
Amit Jindal
G01 - MEASURING TESTING