Amit PALIWAL

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Hillsboro, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
In-line detection of electrical fails on integrated circuits
- Patent number 12,013,442
- Issue date Jun 18, 2024
- Intel Corporation
- Enlan Yuan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE UNDER TEST (DUT) STRUCTURES IN FILL REGIONS OF PRODUCT DIE F...
- Publication number 20240329114
- Publication date Oct 3, 2024
- Intel Corporation
- Sairam Subramanian
- G01 - MEASURING TESTING
Information Patent Application
DEVICE UNDER TEST (DUT) STRUCTURES FOR VOLTAGE CONTRAST (VC) DETECT...
- Publication number 20240329122
- Publication date Oct 3, 2024
- Intel Corporation
- Sairam SUBRAMANIAN
- G01 - MEASURING TESTING
Information Patent Application
DESIGN OF VOLTAGE CONTRAST PROCESS MONITOR
- Publication number 20240112962
- Publication date Apr 4, 2024
- Intel Corporation
- Xiao WEN
- G01 - MEASURING TESTING
Information Patent Application
IN-LINE DETECTION OF ELECTRICAL FAILS ON INTEGRATED CIRCUITS
- Publication number 20200103451
- Publication date Apr 2, 2020
- Enlan YUAN
- H01 - BASIC ELECTRIC ELEMENTS