Amit Raj Pandey

Follow

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Accuracy improvement in biometric fusion based identification
- Patent number 12,056,223
- Issue date Aug 6, 2024
- THALES DIS FRANCE SAS
- Li Songtao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Handling memory errors in computing systems
- Patent number 10,908,987
- Issue date Feb 2, 2021
- Amazon Technologies, Inc.
- Amit Pandey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan-based reset
- Patent number 9,009,552
- Issue date Apr 14, 2015
- Advanced Micro Devices, Inc.
- Bill K. Kwan
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced debug/test capability to a core reset process
- Patent number 8,661,302
- Issue date Feb 25, 2014
- Advanced Micro Devices, Inc.
- Atchyuth K. Gorti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of exhaustively testing an embedded ROM using generated ATPG...
- Patent number 7,568,134
- Issue date Jul 28, 2009
- Advanced Micro Devices, Inc.
- Amit Raj Pandey
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DEEP LEARNING BASED FINGERPRINT MINUTIAE EXTRACTION
- Publication number 20230119918
- Publication date Apr 20, 2023
- THALES DIS FRANCE SAS
- Songtao LI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACCURACY IMPROVEMENT IN BIOMETRIC FUSION BASED IDENTIFICATION
- Publication number 20220358196
- Publication date Nov 10, 2022
- THALES DIS USA Inc.
- Li SONGTAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCED DEBUG/TEST CAPABILITY TO A CORE RESET PROCESS
- Publication number 20120124424
- Publication date May 17, 2012
- Atchyuth K. Gorti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCAN-BASED RESET
- Publication number 20120062283
- Publication date Mar 15, 2012
- Bill K. Kwan
- G01 - MEASURING TESTING