Amit Vijay Nahar

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Allen, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit manufacture and outlier detection
- Patent number 11,686,764
- Issue date Jun 27, 2023
- Texas Instruments Incorporated
- Sirish Boddikurapati
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for testing manufactured products
- Patent number 9,081,051
- Issue date Jul 14, 2015
- Texas Instruments Incorporated
- Amit Vijay Nahar
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor outlier identification using serially-combined data t...
- Patent number 8,126,681
- Issue date Feb 28, 2012
- Texas Instruments Incorporated
- Amit V Nahar
- G01 - MEASURING TESTING
Information Patent Grant
Identification of outlier semiconductor devices using data-driven s...
- Patent number 7,494,829
- Issue date Feb 24, 2009
- Texas Instruments Incorporated
- Suresh Subramaniam
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Fail Density-Based Clustering for Yield Loss Detection
- Publication number 20210181253
- Publication date Jun 17, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Istvan Bauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT MANUFACTURE AND OUTLIER DETECTION
- Publication number 20210063479
- Publication date Mar 4, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Sirish Boddikurapati
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods for Testing Manufactured Products
- Publication number 20130088253
- Publication date Apr 11, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Amit Vijay Nahar
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR OUTLIER IDENTIFICATION USING SERIALLY-COMBINED DATA T...
- Publication number 20110071782
- Publication date Mar 24, 2011
- TEXAS INSTRUMENTS INCORPORATED
- AMIT V. NAHAR
- G01 - MEASURING TESTING
Information Patent Application
Identification of Outlier Semiconductor Devices Using Data-Driven S...
- Publication number 20080262793
- Publication date Oct 23, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Suresh SUBRAMANIAM
- G01 - MEASURING TESTING