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Amit Weingarten
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Ramat Gan, IL
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last 30 patents
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Patent Grant
Mass spectrometer detector and system and method using the same
Patent number
11,823,883
Issue date
Nov 21, 2023
NOVA MEASURING INSTRUMENTS, INC.
Christopher F. Bevis
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light sensor assembly in a vacuum environment
Patent number
11,536,604
Issue date
Dec 27, 2022
EL-MUL TECHNOLOGIES LTD.
Jonathan Garel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer detector and system and method using the same
Patent number
11,183,377
Issue date
Nov 23, 2021
NOVA MEASURING INSTRUMENTS, INC.
Christopher F. Bevis
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle detection assembly, system and method
Patent number
10,910,193
Issue date
Feb 2, 2021
EL-MUL TECHNOLOGIES LTD.
Eli Cheifetz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detection assembly, system and method
Patent number
10,236,155
Issue date
Mar 19, 2019
EL-MUL TECHNOLOGIES LTD.
Eli Cheifetz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Position sensitive STEM detector
Patent number
9,076,632
Issue date
Jul 7, 2015
EL-MUL TECHNOLOGIES LTD.
Silviu Reinhorn
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for monitoring a process of material removal from...
Patent number
6,885,446
Issue date
Apr 26, 2005
Nova Measuring Instruments Ltd.
Vladimir Machavariani
G01 - MEASURING TESTING
Information
Patent Grant
Test structure for metal CMP process control
Patent number
6,654,108
Issue date
Nov 25, 2003
Nova Measuring Instruments Ltd.
Avi Ravid
B24 - GRINDING POLISHING
Patents Applications
last 30 patents
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Patent Application
MASS SPECTROMETER DETECTOR AND SYSTEM AND METHOD USING THE SAME
Publication number
20220223395
Publication date
Jul 14, 2022
NOVA MEASURING INSTRUMENTS, INC.
Christopher F. BEVIS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTROMETER DETECTOR AND SYSTEM AND METHOD USING THE SAME
Publication number
20200066502
Publication date
Feb 27, 2020
Nova Measuring Instruments, Inc.
Christopher F. BEVIS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PARTICLE DETECTION ASSEMBLY, SYSTEM AND METHOD
Publication number
20190259571
Publication date
Aug 22, 2019
EL-MUL TECHNOLOGIES LTD.
ELI CHEIFETZ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETECTION ASSEMBLY, SYSTEM AND METHOD
Publication number
20170069459
Publication date
Mar 9, 2017
EL-MUL TECHNOLOGIES LTD.
ELI CHEIFETZ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON DETECTION SYSTEM
Publication number
20160086765
Publication date
Mar 24, 2016
EL-MUL TECHNOLOGIES LTD.
ELI CHEIFETZ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
POSITION SENSITIVE STEM DETECTOR
Publication number
20150034822
Publication date
Feb 5, 2015
EL-MUL TECHNOLOGIES LTD.
Silviu Reinhorn
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and system for monitoring a process of material removal from...
Publication number
20030155537
Publication date
Aug 21, 2003
NOVA MEASURING INSTRUMENTS LTD.
Vladimir Machavariani
G01 - MEASURING TESTING
Information
Patent Application
Test structure for metal CMP process control
Publication number
20010026364
Publication date
Oct 4, 2001
Nova Measuring Instruments Ltd.
Avi Ravid
B24 - GRINDING POLISHING
Information
Patent Application
Test structure for metal CMP process control
Publication number
20010015811
Publication date
Aug 23, 2001
Nova Measuring Instruments Ltd.
Avi Ravid
B24 - GRINDING POLISHING