Amos Fenigstein

Person

Haifa, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Wavelength selective radiation sensor
- Patent number 11,592,584
- Issue date Feb 28, 2023
- Tower Semiconductor Ltd.
- Amos Fenigstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active quenching for single-photon avalanche diode using one- shot...
- Patent number 10,852,399
- Issue date Dec 1, 2020
- Tower Semiconductor Ltd.
- Amos Fenigstein
- G01 - MEASURING TESTING
Information Patent Grant
Image sensor module and a method for sensing
- Patent number 10,757,355
- Issue date Aug 25, 2020
- TOWER SEMICONDUCTORS LTD.
- Amos Fenigstein
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Image sensor module and a method for evaluating an image sensor
- Patent number 10,210,526
- Issue date Feb 19, 2019
- Tower Semiconductor Ltd.
- Yakov Roizin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Schmitt trigger circuit with hysteresis determined by modified poly...
- Patent number 9,935,618
- Issue date Apr 3, 2018
- Tower Semiconductor Ltd.
- Amos Fenigstein
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Image sensor pixel with memory node having buried channel and diode...
- Patent number 9,865,632
- Issue date Jan 9, 2018
- Tower Semiconductor Ltd.
- Assaf Lahav
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Backside illuminated (BSI) CMOS image sensor (CIS) with a resonant...
- Patent number 9,865,640
- Issue date Jan 9, 2018
- TOWER SEMICONDUCTOR LTD.
- Amos Fenigstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a trench metal insulator metal capacitor
- Patent number 9,741,817
- Issue date Aug 22, 2017
- Tower Semiconductor Ltd.
- Michael Lisiansky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single-exposure high dynamic range CMOS image sensor pixel with int...
- Patent number 9,729,808
- Issue date Aug 8, 2017
- Tower Semiconductor Ltd.
- Amos Fenigstein
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Image sensor pixel with memory node having buried channel and diode...
- Patent number 9,729,810
- Issue date Aug 8, 2017
- Tower Semiconductor Ltd.
- Assaf Lahav
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Back-end processing using low-moisture content oxide cap layer
- Patent number 9,431,455
- Issue date Aug 30, 2016
- Tower Semiconductor, Ltd.
- Amos Fenigstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus, system and method of back side illumination (BSI) comple...
- Patent number 9,356,169
- Issue date May 31, 2016
- Tower Semiconductor Ltd.
- Assaf Lahav
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shared readout low noise global shutter image sensor method
- Patent number 9,210,345
- Issue date Dec 8, 2015
- Tower Semiconductor Ltd.
- Assaf Lahav
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Shared readout low noise global shutter image sensor
- Patent number 9,160,956
- Issue date Oct 13, 2015
- Tower Semiconductor Ltd.
- Assaf Lahav
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Single-exposure high dynamic range CMOS image sensor pixel with int...
- Patent number 9,106,851
- Issue date Aug 11, 2015
- Tower Semiconductor Ltd.
- Amos Fenigstein
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Device having an avalanche photo diode and a method for sensing pho...
- Patent number 8,779,543
- Issue date Jul 15, 2014
- Technion Research and Development Foundation Ltd.
- Yael Nemirovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-K dielectric stack and method of fabricating same
- Patent number 8,722,484
- Issue date May 13, 2014
- Tower Semiconductor Ltd.
- Michael Lisiansky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-resolution integrated X-ray CMOS image sensor
- Patent number 8,501,573
- Issue date Aug 6, 2013
- Tower Semiconductor Ltd.
- Yakov Roizin
- G01 - MEASURING TESTING
Information Patent Grant
CMOS image sensor with wide (intra-scene) dynamic range
- Patent number 8,279,328
- Issue date Oct 2, 2012
- Tower Semiconductor Ltd.
- Assaf Lahav
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
CMOS image sensor pixel with an NMOS charge amplifier
- Patent number 8,203,111
- Issue date Jun 19, 2012
- Tower Semiconductor Ltd.
- Raz Reshef
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
CMOS image sensor with high sensitivity wide dynamic range pixel fo...
- Patent number 8,089,035
- Issue date Jan 3, 2012
- Tower Semiconductor Ltd.
- Assaf Lahav
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for fabricating three-dimensional control-gate architecture...
- Patent number 7,754,564
- Issue date Jul 13, 2010
- Tower Semiconductor Ltd.
- Amos Fenigstein
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for fabricating capacitor structures using the first contact...
- Patent number 7,754,559
- Issue date Jul 13, 2010
- Tower Semiconductor Ltd.
- Efraim Aloni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Via wave guide with curved light concentrator for image sensing dev...
- Patent number 7,678,603
- Issue date Mar 16, 2010
- Tower Semiconductor Ltd.
- Hai Reznik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional control-gate architecture for single poly EPROM m...
- Patent number 7,671,396
- Issue date Mar 2, 2010
- Tower Semiconductor Ltd.
- Amos Fenigstein
- G11 - INFORMATION STORAGE
Information Patent Grant
High resolution integrated X-ray CMOS image sensor
- Patent number 7,608,837
- Issue date Oct 27, 2009
- Tower Semiconductor Ltd.
- Yakov Roizin
- G01 - MEASURING TESTING
Information Patent Grant
Embedded non-volatile memory cell with charge-trapping sidewall spa...
- Patent number 7,482,233
- Issue date Jan 27, 2009
- Tower Semiconductor Ltd.
- Yakov Roizin
- G11 - INFORMATION STORAGE
Information Patent Grant
NROM memory device with enhanced endurance
- Patent number 7,400,538
- Issue date Jul 15, 2008
- Tower Semiconductor Ltd.
- Evgeny Pikhay
- G11 - INFORMATION STORAGE
Information Patent Grant
Via wave guide with curved light concentrator for image sensing dev...
- Patent number 7,358,583
- Issue date Apr 15, 2008
- Tower Semiconductor Ltd.
- Hai Reznik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Embedded non-volatile memory cell with charge-trapping sidewall spa...
- Patent number 7,227,234
- Issue date Jun 5, 2007
- Tower Semiconductor Ltd.
- Yakov Roizin
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
WAVELENGTH SELECTIVE RADIATION SENSOR
- Publication number 20230042154
- Publication date Feb 9, 2023
- Tower Semiconductor Ltd.
- Amos Fenigstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSOR MODULE AND A METHOD FOR SENSING
- Publication number 20200036922
- Publication date Jan 30, 2020
- Amos Fenigstein
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Active Quenching For Single-Photon Avalanche Diode Using One-Shot C...
- Publication number 20190302242
- Publication date Oct 3, 2019
- Tower Semiconductor Ltd.
- Amos Fenigstein
- G01 - MEASURING TESTING
Information Patent Application
Schmitt Trigger Circuit With Hysteresis Determined By Modified Poly...
- Publication number 20180097510
- Publication date Apr 5, 2018
- Tower Semiconductor Ltd.
- Amos Fenigstein
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Image Sensor Pixel With Memory Node Having Buried Channel And Diode...
- Publication number 20170323912
- Publication date Nov 9, 2017
- Tower Semiconductor Ltd.
- Assaf Lahav
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BACKSIDE ILLUMINATED (BSI) CMOS IMAGE SENSOR (CIS) WITH A RESONANT...
- Publication number 20170221941
- Publication date Aug 3, 2017
- Tower Semiconductor Ltd.
- Amos Fenigstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING A TRENCH METAL INSULATOR METAL CAPACITOR
- Publication number 20170213896
- Publication date Jul 27, 2017
- Tower Semiconductor Ltd.
- Michael Lisiansky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSOR MODULE AND A METHOD FOR EVALUATING AN IMAGE SENSOR
- Publication number 20160307203
- Publication date Oct 20, 2016
- Tower Semiconductor Ltd.
- Yakov Roizin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image Sensor Pixel With Memory Node Having Buried Channel And Diode...
- Publication number 20160286151
- Publication date Sep 29, 2016
- Tower Semiconductor Ltd.
- Assaf Lahav
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Back-End Processing Using Low-Moisture Content Oxide Cap Layer
- Publication number 20160133666
- Publication date May 12, 2016
- Tower Semiconductor Ltd.
- Amos Fenigstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS, SYSTEM AND METHOD OF BACK SIDE ILLUMINATION (BSI) COMPLE...
- Publication number 20160005896
- Publication date Jan 7, 2016
- Tower Semiconductor Ltd.
- Assaf Lahav
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Single-Exposure High Dynamic Range CMOS Image Sensor Pixel With Int...
- Publication number 20150350584
- Publication date Dec 3, 2015
- Tower Semiconductor Ltd.
- Amos Fenigstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Single-Exposure High Dynamic Range CMOS Image Sensor Pixel With Int...
- Publication number 20140263950
- Publication date Sep 18, 2014
- Tower Semiconductor Ltd.
- Amos Fenigstein
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Shared Readout Low Noise Global Shutter Image Sensor Method
- Publication number 20140226047
- Publication date Aug 14, 2014
- Tower Semiconductor Ltd.
- Assaf Lahav
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Shared Readout Low Noise Global Shutter Image Sensor
- Publication number 20140226046
- Publication date Aug 14, 2014
- Tower Semiconductor Ltd.
- Assaf Lahav
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DEVICE HAVING AN AVALANCHE PHOTO DIODE AND A METHOD FOR SENSING PHO...
- Publication number 20130099091
- Publication date Apr 25, 2013
- Yael Nemirovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMOS Image Sensor With Wide (Intra-Scene) Dynamic Range
- Publication number 20110013064
- Publication date Jan 20, 2011
- Tower Semiconductor Ltd.
- Assaf Lahav
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CMOS Image Sensor Pixel With Internal Charge Amplifier
- Publication number 20100237228
- Publication date Sep 23, 2010
- Tower Semiconductor Ltd.
- Raz Reshef
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CMOS Image Sensor With High Sensitivity Wide Dynamic Range Pixel Fo...
- Publication number 20090261235
- Publication date Oct 22, 2009
- Tower Semiconductor Ltd.
- Assaf Lahav
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method For Fabricating Capacitor Structures Using The First Contact...
- Publication number 20090239351
- Publication date Sep 24, 2009
- Tower Semiconductor Ltd.
- Efraim Aloni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High-K Dielectric Stack And Method Of Fabricating Same
- Publication number 20090181530
- Publication date Jul 16, 2009
- Tower Semiconductor Ltd.
- Michael Lisiansky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High-Resolution Integrated X-Ray CMOS Image Sensor
- Publication number 20090181491
- Publication date Jul 16, 2009
- Tower Semiconductor Ltd.
- Yakov Roizin
- G01 - MEASURING TESTING
Information Patent Application
Three-Dimensional Control-Gate Architecture For Single Poly EPROM M...
- Publication number 20080160689
- Publication date Jul 3, 2008
- Tower Semiconductor Ltd.
- Amos Fenigstein
- G11 - INFORMATION STORAGE
Information Patent Application
Via Wave Guide With Curved Light Concentrator For Image Sensing Dev...
- Publication number 20080145965
- Publication date Jun 19, 2008
- Tower Semiconductor Ltd.
- Hai Reznik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High Resolution Integrated X-Ray CMOS Image Sensor
- Publication number 20080121808
- Publication date May 29, 2008
- Tower Semiconductor Ltd.
- Yakov Roizin
- G01 - MEASURING TESTING
Information Patent Application
NROM Memory Device With Enhanced Endurance
- Publication number 20080084764
- Publication date Apr 10, 2008
- Tower Semiconductor Ltd.
- Evgeny Pikhay
- G11 - INFORMATION STORAGE
Information Patent Application
Embedded Non-Volatile Memory Cell With Charge-Trapping Sidewall Spa...
- Publication number 20070224751
- Publication date Sep 27, 2007
- Tower Semiconductor Ltd.
- Yakov Roizin
- G11 - INFORMATION STORAGE
Information Patent Application
Via wave guide with curved light concentrator for image sensing dev...
- Publication number 20070200054
- Publication date Aug 30, 2007
- Tower Semiconductor Ltd.
- Hai Reznik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Via wave guide with cone-like light concentrator for image sensing...
- Publication number 20070200055
- Publication date Aug 30, 2007
- Tower Semiconductor Ltd.
- Hai Reznik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Three-dimensional control-gate architecture for single poly EPROM m...
- Publication number 20070166912
- Publication date Jul 19, 2007
- Tower Semiconductor Ltd.
- Amos Fenigstein
- G11 - INFORMATION STORAGE

Amos Fenigstein

Person

Patents Grantslast 30 patents

Wavelength selective radiation sensor

Active quenching for single-photon avalanche diode using one- shot...

Image sensor module and a method for sensing

Image sensor module and a method for evaluating an image sensor

Schmitt trigger circuit with hysteresis determined by modified poly...

Image sensor pixel with memory node having buried channel and diode...

Backside illuminated (BSI) CMOS image sensor (CIS) with a resonant...

Method for manufacturing a trench metal insulator metal capacitor

Single-exposure high dynamic range CMOS image sensor pixel with int...

Image sensor pixel with memory node having buried channel and diode...

Back-end processing using low-moisture content oxide cap layer

Apparatus, system and method of back side illumination (BSI) comple...

Shared readout low noise global shutter image sensor method

Shared readout low noise global shutter image sensor

Single-exposure high dynamic range CMOS image sensor pixel with int...

Device having an avalanche photo diode and a method for sensing pho...

High-K dielectric stack and method of fabricating same

High-resolution integrated X-ray CMOS image sensor

CMOS image sensor with wide (intra-scene) dynamic range

CMOS image sensor pixel with an NMOS charge amplifier

CMOS image sensor with high sensitivity wide dynamic range pixel fo...

Method for fabricating three-dimensional control-gate architecture...

Method for fabricating capacitor structures using the first contact...

Via wave guide with curved light concentrator for image sensing dev...

Three-dimensional control-gate architecture for single poly EPROM m...

High resolution integrated X-ray CMOS image sensor

Embedded non-volatile memory cell with charge-trapping sidewall spa...

NROM memory device with enhanced endurance

Via wave guide with curved light concentrator for image sensing dev...

Embedded non-volatile memory cell with charge-trapping sidewall spa...

Patents Applicationslast 30 patents

WAVELENGTH SELECTIVE RADIATION SENSOR

IMAGE SENSOR MODULE AND A METHOD FOR SENSING

Active Quenching For Single-Photon Avalanche Diode Using One-Shot C...

Schmitt Trigger Circuit With Hysteresis Determined By Modified Poly...

Image Sensor Pixel With Memory Node Having Buried Channel And Diode...

BACKSIDE ILLUMINATED (BSI) CMOS IMAGE SENSOR (CIS) WITH A RESONANT...

METHOD FOR MANUFACTURING A TRENCH METAL INSULATOR METAL CAPACITOR

IMAGE SENSOR MODULE AND A METHOD FOR EVALUATING AN IMAGE SENSOR

Image Sensor Pixel With Memory Node Having Buried Channel And Diode...

Back-End Processing Using Low-Moisture Content Oxide Cap Layer

APPARATUS, SYSTEM AND METHOD OF BACK SIDE ILLUMINATION (BSI) COMPLE...

Single-Exposure High Dynamic Range CMOS Image Sensor Pixel With Int...

Single-Exposure High Dynamic Range CMOS Image Sensor Pixel With Int...

Shared Readout Low Noise Global Shutter Image Sensor Method

Shared Readout Low Noise Global Shutter Image Sensor

DEVICE HAVING AN AVALANCHE PHOTO DIODE AND A METHOD FOR SENSING PHO...

CMOS Image Sensor With Wide (Intra-Scene) Dynamic Range

CMOS Image Sensor Pixel With Internal Charge Amplifier

CMOS Image Sensor With High Sensitivity Wide Dynamic Range Pixel Fo...

Method For Fabricating Capacitor Structures Using The First Contact...

High-K Dielectric Stack And Method Of Fabricating Same

High-Resolution Integrated X-Ray CMOS Image Sensor

Three-Dimensional Control-Gate Architecture For Single Poly EPROM M...

Via Wave Guide With Curved Light Concentrator For Image Sensing Dev...

High Resolution Integrated X-Ray CMOS Image Sensor

NROM Memory Device With Enhanced Endurance

Embedded Non-Volatile Memory Cell With Charge-Trapping Sidewall Spa...

Via wave guide with curved light concentrator for image sensing dev...

Via wave guide with cone-like light concentrator for image sensing...

Three-dimensional control-gate architecture for single poly EPROM m...