Amos Gvirtzman

Person

Moshav Zippori, IL

People

Patents Grantslast 30 patents

Information Patent Grant
High-resolution X-ray diffraction measurement with enhanced sensiti...
- Patent number 8,731,138
- Issue date May 20, 2014
- Jordan Valley Semiconductor Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution X-ray diffraction measurement with enhanced sensiti...
- Patent number 8,243,878
- Issue date Aug 14, 2012
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Multifunction X-ray analysis system
- Patent number 7,551,719
- Issue date Jun 23, 2009
- Jordan Valley Semiconductord Ltd
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Efficient measurement of diffuse X-ray reflections
- Patent number 7,231,016
- Issue date Jun 12, 2007
- Jordan Valley Applied Radiation, Ltd.
- David Berman
- G01 - MEASURING TESTING
Information Patent Grant
Enhancement of X-ray reflectometry by measurement of diffuse reflec...
- Patent number 7,068,753
- Issue date Jun 27, 2006
- Jordan Valley Applied Radiation Ltd.
- David Berman
- G01 - MEASURING TESTING
Information Patent Grant
Dual-wavelength x-ray monochromator
- Patent number 6,907,108
- Issue date Jun 14, 2005
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry with small-angle scattering measurement
- Patent number 6,895,075
- Issue date May 17, 2005
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Dual-wavelength X-ray reflectometry
- Patent number 6,680,996
- Issue date Jan 20, 2004
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of critical dimensions using X-rays
- Patent number 6,556,652
- Issue date Apr 29, 2003
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
X-ray array detector
- Patent number 6,389,102
- Issue date May 14, 2002
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
X-ray microanalyzer for thin films
- Patent number 6,381,303
- Issue date Apr 30, 2002
- Jordan Valley Applied Radiation Ltd.
- Long Vu
- G01 - MEASURING TESTING
Information Patent Grant
X-ray microfluorescence analyzer
- Patent number 6,108,398
- Issue date Aug 22, 2000
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...
- Publication number 20120281814
- Publication date Nov 8, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...
- Publication number 20110164730
- Publication date Jul 7, 2011
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Efficient measurement of diffuse X-ray reflections
- Publication number 20060182220
- Publication date Aug 17, 2006
- David Berman
- G01 - MEASURING TESTING
Information Patent Application
Multifunction X-ray analysis system
- Publication number 20060062351
- Publication date Mar 23, 2006
- JORDAN VALLEY APPLIED RADIATION LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Enhancement of X-ray reflectometry by measurement of diffuse reflec...
- Publication number 20060023836
- Publication date Feb 2, 2006
- David Berman
- G01 - MEASURING TESTING
Information Patent Application
X-ray reflectometry with small-angle scattering measurement
- Publication number 20040156474
- Publication date Aug 12, 2004
- JORDAN VALLEY APPLIED RADIATION LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Dual-wavelength x-ray monochromator
- Publication number 20040151278
- Publication date Aug 5, 2004
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Dual-wavelength X-ray reflectometry
- Publication number 20030156682
- Publication date Aug 21, 2003
- JORDAN VALLEY APPLIED RADIATION LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ARRAY DETECTOR
- Publication number 20020001365
- Publication date Jan 3, 2002
- ISAAC MAZOR
- G01 - MEASURING TESTING

Amos Gvirtzman

Person

Patents Grantslast 30 patents

High-resolution X-ray diffraction measurement with enhanced sensiti...

High-resolution X-ray diffraction measurement with enhanced sensiti...

Multifunction X-ray analysis system

Efficient measurement of diffuse X-ray reflections

Enhancement of X-ray reflectometry by measurement of diffuse reflec...

Dual-wavelength x-ray monochromator

X-ray reflectometry with small-angle scattering measurement

Dual-wavelength X-ray reflectometry

Measurement of critical dimensions using X-rays

X-ray array detector

X-ray microanalyzer for thin films

X-ray microfluorescence analyzer

Patents Applicationslast 30 patents

High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...

High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...

Efficient measurement of diffuse X-ray reflections

Multifunction X-ray analysis system

Enhancement of X-ray reflectometry by measurement of diffuse reflec...

X-ray reflectometry with small-angle scattering measurement

Dual-wavelength x-ray monochromator

Dual-wavelength X-ray reflectometry

X-RAY ARRAY DETECTOR