AMOTZ MAIMON

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CUPERTINO, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Real time defect source identification
- Patent number 6,763,130
- Issue date Jul 13, 2004
- Applied Materials, Inc.
- Sasson Somekh
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
FAB yield enhancement system
- Patent number 6,408,219
- Issue date Jun 18, 2002
- Applied Materials, Inc.
- Patrick H Lamey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, method and medium for managing information
- Patent number 6,199,157
- Issue date Mar 6, 2001
- Applied Materials, Inc.
- Dan Bar Dov
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
FAB YIELD ENHANCEMENT SYSTEM
- Publication number 20010051836
- Publication date Dec 13, 2001
- PATRICK H. LAMEY
- H01 - BASIC ELECTRIC ELEMENTS