Amr A. Abdo

Person

Hopewell Junction, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Test patterns for determining sizing and spacing of sub-resolution...
- Patent number 9,904,757
- Issue date Feb 27, 2018
- GLOBALFOUNDRIES Inc.
- Amr Y. Abdo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample plan creation for optical proximity correction with minimal...
- Patent number 9,405,186
- Issue date Aug 2, 2016
- GLOBALFOUNDRIES, INC.
- Amr Y. Abdo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multifeature test pattern for optical proximity correction model ve...
- Patent number 8,443,309
- Issue date May 14, 2013
- International Business Machines Corporation
- Amr Y. Abdo
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Test pattern for contour calibration in OPC model build
- Patent number 8,234,601
- Issue date Jul 31, 2012
- International Business Machines Corporation
- Amr A. Abdo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Calibration and verification structures for use in optical proximit...
- Patent number 8,161,421
- Issue date Apr 17, 2012
- International Business Machines Corporation
- Ramya Viswanathan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
OPC model calibration process
- Patent number 7,900,169
- Issue date Mar 1, 2011
- International Business Machines Corporation
- Amr Y. Abdo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
TEST PATTERNS FOR DETERMINING SIZING AND SPACING OF SUB-RESOLUTION...
- Publication number 20170193150
- Publication date Jul 6, 2017
- GLOBALFOUNDRIES INC.
- Amr Y. Abdo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE PLAN CREATION FOR OPTICAL PROXIMITY CORRECTION WITH MINIMAL...
- Publication number 20160246167
- Publication date Aug 25, 2016
- GLOBALFOUNDRIES INC.
- Amr Y. Abdo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIFEATURE TEST PATTERN FOR OPTICAL PROXIMITY CORRECTION MODEL VE...
- Publication number 20120227017
- Publication date Sep 6, 2012
- International Business Machines Corporation
- Amr Y. Abdo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Test Pattern for Contour Calibration in OPC Model Build
- Publication number 20110283244
- Publication date Nov 17, 2011
- International Business Machines Corporation
- Amr Y. Abdo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPC MODEL CALIBRATION PROCESS
- Publication number 20100171036
- Publication date Jul 8, 2010
- International Business Machines Corporation
- Amr Y. Abdo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CALIBRATION AND VERIFICATAION STRUCTURES FOR USE IN OPTICAL PROXIMI...
- Publication number 20100005440
- Publication date Jan 7, 2010
- International Business Machines Corporation
- Ramya Viswanathan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Amr A. Abdo

Person

Patents Grantslast 30 patents

Test patterns for determining sizing and spacing of sub-resolution...

Sample plan creation for optical proximity correction with minimal...

Multifeature test pattern for optical proximity correction model ve...

Test pattern for contour calibration in OPC model build

Calibration and verification structures for use in optical proximit...

OPC model calibration process

Patents Applicationslast 30 patents

TEST PATTERNS FOR DETERMINING SIZING AND SPACING OF SUB-RESOLUTION...

SAMPLE PLAN CREATION FOR OPTICAL PROXIMITY CORRECTION WITH MINIMAL...

MULTIFEATURE TEST PATTERN FOR OPTICAL PROXIMITY CORRECTION MODEL VE...

Test Pattern for Contour Calibration in OPC Model Build

OPC MODEL CALIBRATION PROCESS

CALIBRATION AND VERIFICATAION STRUCTURES FOR USE IN OPTICAL PROXIMI...