Membership
Tour
Register
Log in
Amy D. Hanlon
Follow
Person
Santa Barbara, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method of characterizing interactions and screening for effectors
Patent number
9,658,156
Issue date
May 23, 2017
WYATT TECHNOLOGY CORPORATION
Amy D. Hanlon
G01 - MEASURING TESTING
Information
Patent Grant
Method of characterizing interactions and screening for effectors
Patent number
9,459,207
Issue date
Oct 4, 2016
WYATT TECHNOLOGY CORPORATION
Amy D. Hanlon
G01 - MEASURING TESTING
Information
Patent Grant
Multiwell plate lid for improved optical measurements
Patent number
9,347,869
Issue date
May 24, 2016
WYATT TECHNOLOGY CORPORATION
Michael I. Larkin
G01 - MEASURING TESTING
Information
Patent Grant
Multiwell plate lid for improved optical measurements
Patent number
8,976,353
Issue date
Mar 10, 2015
Wyatt Technology Corporation
Michael I. Larkin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF CHARACTERIZING INTERACTIONS AND SCREENING FOR EFFECTORS
Publication number
20150369732
Publication date
Dec 24, 2015
Wyatt Technology Corporation
Amy D. Hanlon
G01 - MEASURING TESTING
Information
Patent Application
Multiwell plate lid for improved optical measurements
Publication number
20150077739
Publication date
Mar 19, 2015
Wyatt Technology Corporation
Michael I. Larkin
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF CHARACTERIZING INTERACTIONS AND SCREENING FOR EFFECTORS
Publication number
20130215424
Publication date
Aug 22, 2013
Wyatt Technology Corporation
Amy D. Hanlon
G01 - MEASURING TESTING
Information
Patent Application
Multiwell plate lid for improved optical measurements
Publication number
20130176556
Publication date
Jul 11, 2013
Wyatt Technology Corporation
Michael I. Larkin
G01 - MEASURING TESTING