An-Ru Cheng

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Hsin-Chu City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit capable of locating failure process layers
- Patent number 7,464,357
- Issue date Dec 9, 2008
- Faraday Technology Corp.
- An-Ru Andrew Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Universal test platform and test method for latch-up
- Patent number 7,089,137
- Issue date Aug 8, 2006
- Faraday Technology Corp.
- Jie-Hong Wang
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit capable of locating failure process layers
- Patent number 7,036,099
- Issue date Apr 25, 2006
- Faraday Technology Corp.
- An-Ru Andrew Cheng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Integrated circuit capable of locating failure process layers
- Publication number 20060123375
- Publication date Jun 8, 2006
- An-Ru Andrew Cheng
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL TEST PLATFORM AND TEST METHOD FOR LATCH-UP
- Publication number 20050049812
- Publication date Mar 3, 2005
- Jie-Hong Wang
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit capable of locating failure process layers
- Publication number 20050022142
- Publication date Jan 27, 2005
- An-Ru Andrew Cheng
- G01 - MEASURING TESTING