Anand Gupta

Follow

Person

Phoenix, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical method and apparatus for inspecting large area planar objects
- Patent number 6,809,809
- Issue date Oct 26, 2004
- Real Time Metrology, Inc.
- Patrick D. Kinney
- G01 - MEASURING TESTING
Information Patent Grant
Increasing the sensitivity of an in-situ particle monitor
- Patent number 6,125,789
- Issue date Oct 3, 2000
- Applied Materials, Inc.
- Anand Gupta
- G01 - MEASURING TESTING
Information Patent Grant
Particle monitor system and method
- Patent number 5,083,865
- Issue date Jan 28, 1992
- Applied Materials, Inc.
- Patrick Kinney
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical method and apparatus for inspecting large area planar objects
- Publication number 20040012775
- Publication date Jan 22, 2004
- Patrick D. Kinney
- G01 - MEASURING TESTING