Anand J. Reddy

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Palo Alto, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device having improved adhesion and reduced blisterin...
- Patent number 7,732,324
- Issue date Jun 8, 2010
- Texas Instruments Incorporated
- Ju-Ai Ruan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduction of punch-thru defects in damascene processing
- Patent number 7,727,885
- Issue date Jun 1, 2010
- Texas Instruments Incorporated
- Phillip Daniel Matz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensitive test structure for assessing pattern anomalies
- Patent number 6,967,110
- Issue date Nov 22, 2005
- Texas Instruments Incorporated
- Richard L. Guldi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Device Having Improved Adhesion and Reduced Blisterin...
- Publication number 20090160059
- Publication date Jun 25, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Ju-Ai Ruan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reduction of punch-thru defects in damascene processing
- Publication number 20080057711
- Publication date Mar 6, 2008
- Texas Instrumentd incorporated
- Phillip Daniel Matz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sensitive test structure for assessing pattern anomalies
- Publication number 20060033503
- Publication date Feb 16, 2006
- Richard L. Guldi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sensitive test structure for assessing pattern anomalies
- Publication number 20040229388
- Publication date Nov 18, 2004
- Richard L. Guldi
- H01 - BASIC ELECTRIC ELEMENTS