Membership
Tour
Register
Log in
Anand T. Krishnan
Follow
Person
Richardson, TX, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Current-voltage-based method for evaluating thin dielectrics based...
Patent number
7,737,717
Issue date
Jun 15, 2010
Texas Instruments Incorporated
Paul Edward Nicollian
G01 - MEASURING TESTING
Information
Patent Grant
Thermal treatment of nitrided oxide to improve negative bias therma...
Patent number
7,682,988
Issue date
Mar 23, 2010
Texas Instruments Incorporated
Husam N. Alshareef
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for reducing charge damage in silicon-on-insulato...
Patent number
7,638,412
Issue date
Dec 29, 2009
Texas Instruments Incorporated
James D. Gallia
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method to identify or screen VMIN drift on memory cells during burn...
Patent number
7,450,452
Issue date
Nov 11, 2008
Texas Instruments Incorporated
Juan A. Rosal
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and system for reducing charge damage in silicon-on-insulato...
Patent number
7,262,468
Issue date
Aug 28, 2007
Texas Instruments Incorporated
James D. Gallia
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for accurate negative bias temperature instabilit...
Patent number
7,218,132
Issue date
May 15, 2007
Texas Instruments Incorporated
Anand T. Krishnan
G01 - MEASURING TESTING
Information
Patent Grant
System and method for accurate negative bias temperature instabilit...
Patent number
7,212,023
Issue date
May 1, 2007
Texas Instruments Incorporated
Anand T. Krishnan
G01 - MEASURING TESTING
Information
Patent Grant
Interface improvement by stress application during oxide growth thr...
Patent number
7,208,380
Issue date
Apr 24, 2007
Texas Instruments Incorporated
Anand T. Krishnan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing antenna proximity lines
Patent number
7,071,092
Issue date
Jul 4, 2006
Texas Instruments Incorporated
Anand T. Krishnan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit having antenna proximity lines coupled to the se...
Patent number
6,969,902
Issue date
Nov 29, 2005
Texas Instruments Incorporated
Anand T. Krishnan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photoconductive thin film for reduction of plasma damage
Patent number
6,770,937
Issue date
Aug 3, 2004
Texas Instruments Incorporated
Anand Krishnan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for improving gate oxide integrity and interface quality in...
Patent number
6,709,932
Issue date
Mar 23, 2004
Texas Instruments Incorporated
Anand T. Krishnan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods for determining charging in semiconductor processing
Patent number
6,582,977
Issue date
Jun 24, 2003
Texas Instruments Incorporated
John Rodriguez
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
INTEGRATED CIRCUIT DIE AND METHOD OF MAKING
Publication number
20140024144
Publication date
Jan 23, 2014
TEXAS INSTRUMENTS INCORPORATED
Palkesh Jain
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTEGRATED CIRCUIT DIE AND METHOD OF MAKING
Publication number
20130161718
Publication date
Jun 27, 2013
TEXAS INSTRUMENTS INCORPORATED
Palkesh Jain
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CURRENT-VOLTAGE-BASED METHOD FOR EVALUATING THIN DIELECTRICS BASED...
Publication number
20090224795
Publication date
Sep 10, 2009
Texas Instruments Inc.
Paul Edward Nicollian
G01 - MEASURING TESTING
Information
Patent Application
Method to Identify or Screen VMIN Drift on Memory Cells During Burn...
Publication number
20070297254
Publication date
Dec 27, 2007
TEXAS INSTRUMENTS INCORPORATED
Juan A. Rosal
G11 - INFORMATION STORAGE
Information
Patent Application
Method and system for reducing charge damage in silicon-on-insulato...
Publication number
20070264804
Publication date
Nov 15, 2007
TEXAS INSTRUMENTS INCORPORATED
James D. Gallia
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device fabricated using a carbon-containing film as a...
Publication number
20070210421
Publication date
Sep 13, 2007
Texas Instruments Inc.
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
System and method for accurate negative bias temperature instabilit...
Publication number
20060076971
Publication date
Apr 13, 2006
Anand T. Krishnan
G01 - MEASURING TESTING
Information
Patent Application
System and method for accurate negative bias temperature instabilit...
Publication number
20060049842
Publication date
Mar 9, 2006
Anand T. Krishnan
G01 - MEASURING TESTING
Information
Patent Application
Thermal treatment of nitrided oxide to improve negative bias therma...
Publication number
20060046514
Publication date
Mar 2, 2006
TEXAS INSTRUMENTS INCORPORATED
Husam N. Alshareef
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Interface improvement by stress application during oxide growth thr...
Publication number
20050208776
Publication date
Sep 22, 2005
Texas Instruments Inc.
Anand T. Krishnan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor antenna proximity lines
Publication number
20050133826
Publication date
Jun 23, 2005
Anand T. Krishnan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor antenna proximity lines
Publication number
20040183102
Publication date
Sep 23, 2004
Anand T. Krishnan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR IMPROVING GATE OXIDE INTEGRITY & INTERFACE QUALITY IN A...
Publication number
20040043567
Publication date
Mar 4, 2004
Anand T. Krishnan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and system for reducing charge damage in silicon-on-insulato...
Publication number
20030122190
Publication date
Jul 3, 2003
TEXAS INSTRUMENTS INCORPORATED
James D. Gallia
H01 - BASIC ELECTRIC ELEMENTS