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Anatoly Fabrikant
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Fremont, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Wavefront measurement pre-smoothing systems and methods
Patent number
10,292,864
Issue date
May 21, 2019
AMO Development, LLC
Anatoly Fabrikant
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Systems and methods for laser beam direct measurement and error budget
Patent number
10,179,070
Issue date
Jan 15, 2019
Amo Manufacturing USA, LLC
Ihor Berezhnyy
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Treatment validation systems and methods
Patent number
10,098,785
Issue date
Oct 16, 2018
AMO Development, LLC
Guang-ming Dai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Tilt compensation, measurement, and associated adjustment of refrac...
Patent number
10,098,783
Issue date
Oct 16, 2018
AMO Development, LLC
Dimitri Chernyak
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Compensation systems and methods for flap induced aberrations
Patent number
10,028,862
Issue date
Jul 24, 2018
AMO Development, LLC
Guang-ming Dai
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Systems and methods for treatment deconvolution using multi-scale k...
Patent number
9,814,620
Issue date
Nov 14, 2017
AMO Development, LLC
Guang-ming Dai
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Systems and methods for treatment target deconvolution
Patent number
9,659,151
Issue date
May 23, 2017
AMO Development, LLC
Guang-ming Dai
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Wavefront measurement pre-smoothing systems and methods
Patent number
9,655,513
Issue date
May 23, 2017
AMO Development, LLC
Anatoly Fabrikant
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
System and method for ophthalmic surface measurements based on obje...
Patent number
9,510,747
Issue date
Dec 6, 2016
AMO Development, LLC
Anatoly Fabrikant
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Treatment validation systems and methods
Patent number
9,501,621
Issue date
Nov 22, 2016
AMO Development, LLC
Guang-ming Dai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for treatment deconvolution using dual scale ke...
Patent number
9,498,117
Issue date
Nov 22, 2016
AMO Development, LLC
Guang-ming Dai
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Tilt compensation, measurement, and associated adjustment of refrac...
Patent number
8,978,660
Issue date
Mar 17, 2015
AMO Development, LLC
Dimitri Chernyak
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Apparatus and methods for detecting overlay errors using scatterometry
Patent number
7,933,016
Issue date
Apr 26, 2011
KLA-Tencor Technologies Corporation
Walter D. Mieher
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for detecting overlay errors using scatterometry
Patent number
7,876,440
Issue date
Jan 25, 2011
KLA-Tencor Technologies Corporation
Walter D. Mieher
G01 - MEASURING TESTING
Information
Patent Grant
Parametric profiling using optical spectroscopic systems
Patent number
7,826,071
Issue date
Nov 2, 2010
KLA-Tencor Corporation
Andrei V. Shchegrov
G01 - MEASURING TESTING
Information
Patent Grant
System for scatterometric measurements and applications
Patent number
7,821,654
Issue date
Oct 26, 2010
KLA-Tencor Corporation
Anatoly Fabrikant
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for detecting overlay errors using scatterometry
Patent number
7,663,753
Issue date
Feb 16, 2010
KLA-Tencor Technologies Corporation
Walter D. Mieher
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for detecting overlay errors using scatterometry
Patent number
7,564,557
Issue date
Jul 21, 2009
KLA-Tencor Technologies Corp.
Walter D. Mieher
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for detecting overlay errors using scatterometry
Patent number
7,433,040
Issue date
Oct 7, 2008
KLA-Tencor Technologies Corp.
Walter D. Mieher
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for detecting overlay errors using scatterometry
Patent number
7,385,699
Issue date
Jun 10, 2008
KLA-Tencor Technologies Corporation
Walter D. Mieher
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for detecting overlay errors using scatterometry
Patent number
7,317,531
Issue date
Jan 8, 2008
KLA-Tencor Technologies Corporation
Walter D. Mieher
G01 - MEASURING TESTING
Information
Patent Grant
Parametric profiling using optical spectroscopic systems to adjust...
Patent number
7,312,881
Issue date
Dec 25, 2007
KLA-Tencor Technologies Corporation
Andrei V. Shchegrov
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for detecting overlay errors using scatterometry
Patent number
7,301,634
Issue date
Nov 27, 2007
KLA-Tencor Technologies Corporation
Walter D. Mieher
G01 - MEASURING TESTING
Information
Patent Grant
System for scatterometric measurements and applications
Patent number
7,301,649
Issue date
Nov 27, 2007
KLA-Tencor Technologies Corporation
Anatoly Fabrikant
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for detecting overlay errors using scatterometry
Patent number
7,298,481
Issue date
Nov 20, 2007
KLA-Tencor Technologies Corporation
Walter D. Mieher
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for detecting overlay errors using scatterometry
Patent number
7,289,213
Issue date
Oct 30, 2007
KLA-Tencor Technologies Corporation
Walter D. Mieher
G01 - MEASURING TESTING
Information
Patent Grant
Parametric profiling using optical spectroscopic systems
Patent number
7,280,230
Issue date
Oct 9, 2007
KLA-Tencor Technologies Corporation
Andrei V. Shchegrov
G01 - MEASURING TESTING
Information
Patent Grant
System for scatterometric measurements and applications
Patent number
7,099,005
Issue date
Aug 29, 2006
KLA-Tencor Technologies Corporation
Anatoly Fabrikant
G01 - MEASURING TESTING
Information
Patent Grant
Parametric profiling using optical spectroscopic systems
Patent number
7,023,549
Issue date
Apr 4, 2006
KLA-Tencor Technologies Corporation
Andrei V. Shchegrov
G01 - MEASURING TESTING
Information
Patent Grant
Parametric profiling using optical spectroscopic systems
Patent number
6,900,892
Issue date
May 31, 2005
KLA-Tencor Technologies Corporation
Andrei V. Shchegrov
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS FOR TREATMENT TARGET DECONVOLUTION
Publication number
20170255757
Publication date
Sep 7, 2017
AMO DEVELOPMENT, LLC
Guang-ming Dai
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
WAVEFRONT MEASUREMENT PRE-SMOOTHING SYSTEMS AND METHODS
Publication number
20170143539
Publication date
May 25, 2017
AMO DEVELOPMENT, LLC
Anatoly Fabrikant
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
SYSTEMS AND METHODS FOR TREATMENT DECONVOLUTION USING MULTI-SCALE K...
Publication number
20170049622
Publication date
Feb 23, 2017
AMO DEVELOPMENT, LLC
Guang-ming Dai
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
TREATMENT VALIDATION SYSTEMS AND METHODS
Publication number
20170035611
Publication date
Feb 9, 2017
AMO DEVELOPMENT, LLC
Guang-ming Dai
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
Systems and Methods for Laser Beam Direct Measurement and Error Budget
Publication number
20160022492
Publication date
Jan 28, 2016
AMO MANUFACTURING USA, LLC
Ihor Berezhnyy
G01 - MEASURING TESTING
Information
Patent Application
WAVEFRONT MEASUREMENT PRE-SMOOTHING SYSTEMS AND METHODS
Publication number
20150182112
Publication date
Jul 2, 2015
Anatoly Fabrikant
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
TILT COMPENSATION, MEASUREMENT, AND ASSOCIATED ADJUSTMENT OF REFRAC...
Publication number
20150157499
Publication date
Jun 11, 2015
AMO DEVELOPMENT, LLC
Dimitri Chernyak
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
TREATMENT VALIDATION SYSTEMS AND METHODS
Publication number
20150134316
Publication date
May 14, 2015
AMO DEVELOPMENT, LLC
Guang-ming Dai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR TREATMENT DECONVOLUTION USING DUAL SCALE KE...
Publication number
20150066466
Publication date
Mar 5, 2015
AMO DEVELOPMENT, LLC
Dimitri Chernyak
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
COMPENSATION SYSTEMS AND METHODS FOR FLAP INDUCED ABERRATIONS
Publication number
20140163535
Publication date
Jun 12, 2014
AMO DEVELOPMENT, LLC
Guang-ming Dai
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
BASIS DATA APODIZATION SYSTEMS AND METHODS
Publication number
20140135748
Publication date
May 15, 2014
AMO DEVELOPMENT, LLC
Guang-ming Dai
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
SYSTEMS AND METHODS FOR TREATMENT TARGET DECONVOLUTION
Publication number
20140095137
Publication date
Apr 3, 2014
AMO DEVELOPMENT, LLC
Guang-ming Dai
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
SYSTEM AND METHOD FOR OPHTHALMIC SURFACE BASED ON OBJECTIVE QUALITY...
Publication number
20130204237
Publication date
Aug 8, 2013
AMO DEVELOPMENT, LLC
ANATOLY FABRIKANT
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
SYSTEMS AND METHODS FOR CORRECTING HIGH ORDER ABERRATIONS IN LASER...
Publication number
20130190736
Publication date
Jul 25, 2013
AMO MANUFACTURING USA, LLC
Anatoly Fabrikant
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
SYSTEM AND METHOD FOR OPHTHALMIC SURFACE MEASUREMENTS BASED ON SEQU...
Publication number
20130138094
Publication date
May 30, 2013
AMO DEVELOPMENT, LLC
Anatoly Fabrikant
F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information
Patent Application
TILT COMPENSATION, MEASUREMENT, AND ASSOCIATED ADJUSTMENT OF REFRAC...
Publication number
20130023863
Publication date
Jan 24, 2013
AMO DEVELOPMENT, LLC
Dimitri Chernyak
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
APPARATUS AND METHODS FOR DETECTING OVERLAY ERRORS USING SCATTEROMETRY
Publication number
20100091284
Publication date
Apr 15, 2010
KLA-Tencor Technologies Corporation
Walter D. Mieher
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHODS FOR DETECTING OVERLAY ERRORS USING SCATTEROMETRY
Publication number
20090284744
Publication date
Nov 19, 2009
KLA-Tencor Technologies Corporation
Walter D. Mieher
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR SCATTEROMETRIC MEASUREMENTS AND APPLICATIONS
Publication number
20090195779
Publication date
Aug 6, 2009
Anatoly Fabrikant
G02 - OPTICS
Information
Patent Application
Parametric Profiling Using Optical Spectroscopic Systems
Publication number
20090135416
Publication date
May 28, 2009
KLA-Tencor Technologies Corporation
Andrei V. Shchegrov
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHODS FOR DETECTING OVERLAY ERRORS USING SCATTEROMETRY
Publication number
20080094630
Publication date
Apr 24, 2008
KLA-Tencor Technologies Corporation
Walter D. Mieher
G01 - MEASURING TESTING
Information
Patent Application
System for Scatterometric Measurements and Applications
Publication number
20080084567
Publication date
Apr 10, 2008
Anatoly Fabrikant
G02 - OPTICS
Information
Patent Application
APPARATUS AND METHODS FOR DETECTING OVERLAY ERRORS USING SCATTEROMETRY
Publication number
20080049226
Publication date
Feb 28, 2008
KLA-Tencor Technologies Corporation
Walter D. Mieher
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHODS FOR DETECTING OVERLAY ERRORS USING SCATTEROMETRY
Publication number
20080024766
Publication date
Jan 31, 2008
KLA-Tencor Technologies Corporation
Walter D. Mieher
G01 - MEASURING TESTING
Information
Patent Application
Parametric profiling using optical spectroscopic systems to adjust...
Publication number
20060132806
Publication date
Jun 22, 2006
Andrei V. Shchegrov
G01 - MEASURING TESTING
Information
Patent Application
System for scatterometric measurements and applications
Publication number
20050274901
Publication date
Dec 15, 2005
Anatoly Fabrikant
G02 - OPTICS
Information
Patent Application
Parametric profiling using optical spectroscopic systems
Publication number
20040257588
Publication date
Dec 23, 2004
Andrei V. Shchegrov
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and methods for detecting overlay errors using scatterometry
Publication number
20040233443
Publication date
Nov 25, 2004
KLA-Tencor Technologies Corporation
Walter D. Mieher
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and methods for detecting overlay errors using scatterometry
Publication number
20040233439
Publication date
Nov 25, 2004
KLA-Tencor Technologies Corporation
Walter D. Mieher
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and methods for detecting overlay errors using scatterometry
Publication number
20040233440
Publication date
Nov 25, 2004
KLA-Tencor Technologies Corporation
Walter D. Mieher
G01 - MEASURING TESTING