Anderson Chou

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Hillsboro, OR, US

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Patents Applicationslast 30 patents

Information Patent Application
OPTICAL AND X-RAY METROLOGY METHODS FOR PATTERNED SEMICONDUCTOR STR...
- Publication number 20250237619
- Publication date Jul 24, 2025
- KLA Corporation
- Daniel James Haxton
- G01 - MEASURING TESTING
Information Patent Application
Measurements Of Semiconductor Structures Based On Data Collected At...
- Publication number 20250224344
- Publication date Jul 10, 2025
- KLA Corporation
- Houssam Chouaib
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRANSISTOR CHANNEL STRESS AND MOBILITY METROLOGY USING MULTIPASS SP...
- Publication number 20250146893
- Publication date May 8, 2025
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL AND X-RAY METROLOGY METHODS FOR PATTERNED SEMICONDUCTOR STR...
- Publication number 20250146961
- Publication date May 8, 2025
- KLA Corporation
- Daniel James Haxton
- G01 - MEASURING TESTING
Information Patent Application
SPECTRA DELTA METROLOGY
- Publication number 20250123225
- Publication date Apr 17, 2025
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
Multiple Pass Optical Measurements Of Semiconductor Structures
- Publication number 20250012734
- Publication date Jan 9, 2025
- KLA Corporation
- Zhengquan Tan
- H01 - BASIC ELECTRIC ELEMENTS