Andre Schepp

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Fermwald, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for determining positions of structures on a mask
- Patent number 8,248,618
- Issue date Aug 21, 2012
- Vistec Semiconductor Systems GmbH
- Klaus Rinn
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for Determining Positions of Structures on a Mask
- Publication number 20100220339
- Publication date Sep 2, 2010
- Vistec Semiconductor Systems GmbH
- Klaus Rinn
- G01 - MEASURING TESTING