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Andre Scherz
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Baltimore, MD, US
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last 30 patents
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Patent Grant
System and method for automated sample preparation
Patent number
9,931,644
Issue date
Apr 3, 2018
Becton, Dickinson and Company
Kevin Bailey
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Grant
System and method for automated sample preparation
Patent number
9,381,524
Issue date
Jul 5, 2016
Becton, Dickinson and Company
Kevin Bailey
B04 - CENTRIFUGAL APPARATUS OR MACHINES FOR CARRYING-OUT PHYSICAL OR CHEMICAL...
Information
Patent Grant
Method and system for measurement of sidewall damage in etched diel...
Patent number
7,362,108
Issue date
Apr 22, 2008
Solid State Measurements, Inc.
Vladimir V. Talanov
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for measurement of dielectric constant of thin fi...
Patent number
7,285,963
Issue date
Oct 23, 2007
Solid State Measurements, Inc.
Vladimir V. Talanov
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SYSTEM AND METHOD FOR AUTOMATED SAMPLE PREPARATION
Publication number
20160318040
Publication date
Nov 3, 2016
Becton, Dickinson and Company
Kevin Bailey
B04 - CENTRIFUGAL APPARATUS OR MACHINES FOR CARRYING-OUT PHYSICAL OR CHEMICAL...
Information
Patent Application
Method and system for measurement of sidewall damage in etched diel...
Publication number
20060087305
Publication date
Apr 27, 2006
Vladimir V. Talanov
G01 - MEASURING TESTING
Information
Patent Application
Method and system for measurement of dielectric constant of thin fi...
Publication number
20050230619
Publication date
Oct 20, 2005
Vladimir V. Talanov
G01 - MEASURING TESTING