Andreas Benez

Person

  • Sindelfingen, DE

Patents Grantslast 30 patents

  • Information Patent Grant

    Scanning electron beam device

    • Patent number 5,422,486
    • Issue date Jun 6, 1995
    • ICT Integrated Circuit Testing Gesellschaft, fur Halbleiterpruftechnik MbH
    • Karl H. Herrmann
    • H01 - BASIC ELECTRIC ELEMENTS