Andreas Berghaus

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San Francisco, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Wear coating applied to an atomic force probe tip
- Patent number 6,504,151
- Issue date Jan 7, 2003
- FEI Company
- Thomas Owen Mitchell
- G01 - MEASURING TESTING
Information Patent Grant
Interpolated height determination in an atomic force microscope
- Patent number 6,244,103
- Issue date Jun 12, 2001
- Surface/Interface, Inc.
- Andreas Berghaus
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Micromachined microprobe
- Publication number 20030197123
- Publication date Oct 23, 2003
- Thomas Owen Mitchell
- G01 - MEASURING TESTING