Andreas Boehm

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Neubiberg, DE

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device with sensor for crack detection
- Patent number 11,424,358
- Issue date Aug 23, 2022
- Infineon Technologies Dresden GmbH & Co. KG
- Joachim Weyers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing a semiconductor arrangement
- Patent number 10,971,620
- Issue date Apr 6, 2021
- Infineon Technologies Dresden GmbH & Co. KG
- Joachim Weyers
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Device
- Publication number 20200321463
- Publication date Oct 8, 2020
- Joachim Weyers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Producing a Semiconductor Arrangement
- Publication number 20190393334
- Publication date Dec 26, 2019
- Infineon Technologies Dresden GmbH & Co. KG
- Joachim Weyers
- H01 - BASIC ELECTRIC ELEMENTS