Andreas Brekenfeld

Person

Bremen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Hybrid mass spectrometric system
- Patent number 11,195,710
- Issue date Dec 7, 2021
- Melvin Andrew Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization chamber with temperature-controlled gas feed
- Patent number 9,824,873
- Issue date Nov 21, 2017
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-nozzle chip for electrospray ionization in mass spectrometers
- Patent number 9,242,258
- Issue date Jan 26, 2016
- Andreas Brekenfeld
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Ejection of ion clouds from 3D RF ion traps
- Patent number 8,901,491
- Issue date Dec 2, 2014
- Bruker Daltonik, GmbH
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation of ions in overloaded RF ion traps
- Patent number 8,324,566
- Issue date Dec 4, 2012
- Bruker Daltonik GmbH
- Desmond Allen Kaplan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fragmentation of analyte ions by collisions in RF ion traps
- Patent number 8,198,583
- Issue date Jun 12, 2012
- Bruker Daltonik GmbH
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apertured diaphragms between RF ion guides
- Patent number 8,003,938
- Issue date Aug 23, 2011
- Bruker Daltonik GmbH
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration curves for time-of-flight mass spectrometers
- Patent number 7,851,746
- Issue date Dec 14, 2010
- Bruker Daltonik GmbH
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Collision-induced decomposition of ions in RF ion traps
- Patent number 7,847,246
- Issue date Dec 7, 2010
- Bruker Daltonik, GmbH
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement of light fragment ions with ion traps
- Patent number 7,615,742
- Issue date Nov 10, 2009
- Bruker Daltonik GmbH
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for the transport of ions into a vacuum
- Patent number 7,462,822
- Issue date Dec 9, 2008
- Bruker Daltonik, GmbH
- Christian Gebhardt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion fragmentation by electron transfer in ion traps
- Patent number 7,456,397
- Issue date Nov 25, 2008
- Bruker Daltonik GmbH
- Ralf Hartmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guides with RF diaphragm stacks
- Patent number 7,391,021
- Issue date Jun 24, 2008
- Bruker Dalton K GmbH
- Carsten Stoermer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for producing mass spectrometer spectra with r...
- Patent number 6,836,742
- Issue date Dec 28, 2004
- Bruker Daltonik GmbH
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion-guide systems
- Patent number 6,674,071
- Issue date Jan 6, 2004
- Bruker Daltonik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion filling control in ion trap mass spectrometers
- Patent number 6,600,154
- Issue date Jul 29, 2003
- Bruker Daltonik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fragmentation in quadrupole ion trap mass spectrometers
- Patent number 6,410,913
- Issue date Jun 25, 2002
- Bruker Daltonik GmbH
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
IONIZATION CHAMBER WITH TEMPERATURE-CONTROLLED GAS FEED
- Publication number 20160086784
- Publication date Mar 24, 2016
- Bruker Daltonik GmbH
- Andreas BREKENFELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-NOZZLE CHIP FOR ELECTROSPRAY IONIZATION IN MASS SPECTROMETERS
- Publication number 20140284406
- Publication date Sep 25, 2014
- Andreas BREKENFELD
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
EJECTION OF ION CLOUDS FROM 3D RF ION TRAPS
- Publication number 20140008533
- Publication date Jan 9, 2014
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ISOLATION OF IONS IN OVERLOADED RF ION TRAPS
- Publication number 20120223222
- Publication date Sep 6, 2012
- Bruker Daltonik GmbH
- Desmond Allen Kaplan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COLLISION-INDUCED DECOMPOSITION OF IONS IN RF ION TRAPS
- Publication number 20110127424
- Publication date Jun 2, 2011
- Bruker Daltonik GmbH
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APERTURED DIAPHRAGMS BETWEEN RF ION GUIDES
- Publication number 20100102221
- Publication date Apr 29, 2010
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FRAGMENTATION OF ANALYTE IONS BY COLLISIONS IN RF ION TRAPS
- Publication number 20090283672
- Publication date Nov 19, 2009
- Bruker Daltonik GmbH
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CALIBRATION CURVES FOR TIME-OF-FLIGHT MASS SPECTROMETERS
- Publication number 20080308724
- Publication date Dec 18, 2008
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COLLISION-INDUCED DECOMPOSITION OF IONS IN RF ION TRAPS
- Publication number 20080135747
- Publication date Jun 12, 2008
- Bruker Daltonik GmbH
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measurement of light fragment ions with ion traps
- Publication number 20060289738
- Publication date Dec 28, 2006
- Bruker Daltonik GmbH
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion fragmentation by electron transfer in ion traps
- Publication number 20060186331
- Publication date Aug 24, 2006
- Bruker Daltonik GmbH
- Ralf Hartmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for the transport of ions into a vacuum
- Publication number 20060186329
- Publication date Aug 24, 2006
- Bruker Daltonik GmbH
- Christian Gebhardt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion guides with RF diaphragm stacks
- Publication number 20060076485
- Publication date Apr 13, 2006
- Bruker Daltonik GmbH
- Carsten Stoermer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for producing mass spectrometer spectra with r...
- Publication number 20030114993
- Publication date Jun 19, 2003
- Bruker Daltonik GmbH
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS

Andreas Brekenfeld

Person

Patents Grantslast 30 patents

Hybrid mass spectrometric system

Ionization chamber with temperature-controlled gas feed

Multi-nozzle chip for electrospray ionization in mass spectrometers

Ejection of ion clouds from 3D RF ion traps

Isolation of ions in overloaded RF ion traps

Fragmentation of analyte ions by collisions in RF ion traps

Apertured diaphragms between RF ion guides

Calibration curves for time-of-flight mass spectrometers

Collision-induced decomposition of ions in RF ion traps

Measurement of light fragment ions with ion traps

Apparatus and method for the transport of ions into a vacuum

Ion fragmentation by electron transfer in ion traps

Ion guides with RF diaphragm stacks

Method and apparatus for producing mass spectrometer spectra with r...

Ion-guide systems

Ion filling control in ion trap mass spectrometers

Fragmentation in quadrupole ion trap mass spectrometers

Patents Applicationslast 30 patents

IONIZATION CHAMBER WITH TEMPERATURE-CONTROLLED GAS FEED

MULTI-NOZZLE CHIP FOR ELECTROSPRAY IONIZATION IN MASS SPECTROMETERS

EJECTION OF ION CLOUDS FROM 3D RF ION TRAPS

ISOLATION OF IONS IN OVERLOADED RF ION TRAPS

COLLISION-INDUCED DECOMPOSITION OF IONS IN RF ION TRAPS

APERTURED DIAPHRAGMS BETWEEN RF ION GUIDES

FRAGMENTATION OF ANALYTE IONS BY COLLISIONS IN RF ION TRAPS

CALIBRATION CURVES FOR TIME-OF-FLIGHT MASS SPECTROMETERS

COLLISION-INDUCED DECOMPOSITION OF IONS IN RF ION TRAPS

Measurement of light fragment ions with ion traps

Ion fragmentation by electron transfer in ion traps

Apparatus and method for the transport of ions into a vacuum

Ion guides with RF diaphragm stacks

Method and apparatus for producing mass spectrometer spectra with r...