Andreas Franz

Person

Kienberg, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Photoelectric position measuring system that optimizes modulation o...
- Patent number 6,472,658
- Issue date Oct 29, 2002
- Dr. Johannes Heidenhain GmbH
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Grant
Phase grating and method of producing phase grating
- Patent number 5,786,931
- Issue date Jul 28, 1998
- Johannes Heidenhain GmbH
- Peter Speckbacher
- G02 - OPTICS
Information Patent Grant
Phase grating having an unprotected relief structure with a grating...
- Patent number 5,696,584
- Issue date Dec 9, 1997
- Johannes Heidenhain GmbH
- Andreas Franz
- G02 - OPTICS
Information Patent Grant
Absolute interferometer measuring process and apparatus having a me...
- Patent number 5,631,736
- Issue date May 20, 1997
- Dr. Johannes Heidenhain GmbH
- Jurgen Thiel
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring method and apparatus for generating periodic sig...
- Patent number 5,583,798
- Issue date Dec 10, 1996
- Dr. Johannes Heidenhain GmbH
- Andreas Franz
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric position measuring system using gratings having speci...
- Patent number 5,576,537
- Issue date Nov 19, 1996
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Dual-beam interferometer with a phase grating
- Patent number 5,574,560
- Issue date Nov 12, 1996
- Dr. Johannes Heidenhain GmbH
- Andreas Franz
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring absolute measurements having two...
- Patent number 5,521,704
- Issue date May 28, 1996
- Jurgen Thiel
- G01 - MEASURING TESTING
Information Patent Grant
Waveguide type displacement interferometer having two reference paths
- Patent number 5,396,328
- Issue date Mar 7, 1995
- Dr. Johannes Heidenhain GmbH
- Dieter Jestel
- G01 - MEASURING TESTING
Information Patent Grant
Device for coupling and/or decoupling beams of light, with an integ...
- Patent number 5,271,078
- Issue date Dec 14, 1993
- Dr. Johannes Heidenhain GmbH
- Andreas Franz
- G02 - OPTICS
Information Patent Grant
Angle measuring device with correction grid
- Patent number 5,173,601
- Issue date Dec 22, 1992
- Dr. Johannes Heidenhain GmbH
- Andreas Franz
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method having at least one waveguide coupler to creat...
- Patent number 5,162,869
- Issue date Nov 10, 1992
- Johannes Heidenhain GmbH
- Dieter Michel
- G02 - OPTICS
Information Patent Grant
Integrated optical sensor arrangement with detecting means, and mea...
- Patent number 5,113,066
- Issue date May 12, 1992
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Photoelectric position measuring system that optimizes modulation o...
- Publication number 20020011559
- Publication date Jan 31, 2002
- Elmar Mayer
- G01 - MEASURING TESTING

Andreas Franz

Person

Patents Grantslast 30 patents

Photoelectric position measuring system that optimizes modulation o...

Phase grating and method of producing phase grating

Phase grating having an unprotected relief structure with a grating...

Absolute interferometer measuring process and apparatus having a me...

Position measuring method and apparatus for generating periodic sig...

Photoelectric position measuring system using gratings having speci...

Dual-beam interferometer with a phase grating

Apparatus and method for measuring absolute measurements having two...

Waveguide type displacement interferometer having two reference paths

Device for coupling and/or decoupling beams of light, with an integ...

Angle measuring device with correction grid

Apparatus and method having at least one waveguide coupler to creat...

Integrated optical sensor arrangement with detecting means, and mea...

Patents Applicationslast 30 patents

Photoelectric position measuring system that optimizes modulation o...