Andreas Glowatz

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Heidenau, DE

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Patents Grantslast 30 patents

Information Patent Grant
Cell-aware fault model generation for delay faults
- Patent number 8,990,760
- Issue date Mar 24, 2015
- Mentor Graphics Corporation
- Friedrich Hapke
- G01 - MEASURING TESTING
Information Patent Grant
Multi-targeting boolean satisfiability-based test pattern generation
- Patent number 8,689,069
- Issue date Apr 1, 2014
- Mentor Graphics Corporation
- Rene Krenz-Baath
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for selectively masking test responses
- Patent number 7,376,873
- Issue date May 20, 2008
- NXP B.V.
- Hendrikus Petrus Elisabeth Vranken
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement and method of testing an integrated circuit
- Patent number 6,789,219
- Issue date Sep 7, 2004
- Koninklijke Philips Electronics N.V.
- Friedrich Hapke
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-TARGETING BOOLEAN SATISFIABILITY-BASED TEST PATTERN GENERATION
- Publication number 20120317454
- Publication date Dec 13, 2012
- Mentor Graphics Corporation
- RENE KRENZ-BAATH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Cell-Aware Fault Model Creation And Pattern Generation
- Publication number 20100229061
- Publication date Sep 9, 2010
- Friedrich HAPKE
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT ARRANGEMENT AND METHOD OF TESTING AND/OR DIAGNOSING THE SAME
- Publication number 20090013230
- Publication date Jan 8, 2009
- NXP B.V.
- Andreas Glowatz
- G01 - MEASURING TESTING
Information Patent Application
Method and system for selectively masking test responses
- Publication number 20070067688
- Publication date Mar 22, 2007
- Koninklijke Philips Electronics N.V.
- Hendrikus Petrus Elisabeth Vranken
- G01 - MEASURING TESTING
Information Patent Application
Arrangement and method of testing an integrated circuit
- Publication number 20020069385
- Publication date Jun 6, 2002
- Friedrich Hapke
- G01 - MEASURING TESTING