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Andreas Gustav Nagy
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Muenchen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
System for post-processsing of electronic components
Patent number
9,255,965
Issue date
Feb 9, 2016
Multitest Elektronische Systeme GmbH
Reinhart Richter
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for removing tested semiconductor components
Patent number
9,014,841
Issue date
Apr 21, 2015
Multitest Elektronishche Systeme GmbH
Thomas Hofmann
G01 - MEASURING TESTING
Information
Patent Grant
System for post-processing of electronic components
Patent number
8,717,048
Issue date
May 6, 2014
Multitest Elektronische Systems GmbH
Reinhart Richter
G01 - MEASURING TESTING
Information
Patent Grant
Closure mechanism for pressure test chambers for testing electronic...
Patent number
8,449,002
Issue date
May 28, 2013
Multitest Elektronische Systeme GmbH
Andreas Nagy
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Device for testing electronic components, in particular ICs, having...
Patent number
7,633,304
Issue date
Dec 15, 2009
Multitest Elektronische Systeme GmbH
Max Schaule
G01 - MEASURING TESTING
Information
Patent Grant
Sleeve on a drum and changing said sleeve
Patent number
7,171,139
Issue date
Jan 30, 2007
Eastman Kodak Company
Andreas Gustav Nagy
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM FOR POST-PROCESSSING OF ELECTRONIC COMPONENTS
Publication number
20140167798
Publication date
Jun 19, 2014
Multitest elektronische Systeme GmbH
Reinhart Richter
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR REMOVING TESTED SEMICONDUCTOR COMPONENTS
Publication number
20130338818
Publication date
Dec 19, 2013
Thomas Hofmann
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR TESTING ELECTRONIC COMPONENT DEVICES ON A CAR...
Publication number
20130335108
Publication date
Dec 19, 2013
Andreas Nagy
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR POST-PROCESSING OF ELECTRONIC COMPONENTS
Publication number
20110043231
Publication date
Feb 24, 2011
Reinhart Richter
G01 - MEASURING TESTING
Information
Patent Application
CLOSURE MECHANISM FOR PRESSURE TEST CHAMBERS FOR TESTING ELECTRONIC...
Publication number
20100193520
Publication date
Aug 5, 2010
Multitest elektronische Systeme GmbH
Andreas Nagy
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR TESTING ELECTRONIC COMPONENTS, IN PARTICULAR ICS, HAVING...
Publication number
20090015277
Publication date
Jan 15, 2009
Max Schaule
G01 - MEASURING TESTING
Information
Patent Application
Sleeve on a drum and changing said sleeve
Publication number
20050069353
Publication date
Mar 31, 2005
Andreas Gustav Nagy
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS