Andreas Haase

Person

Bremen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for the analytical measurement of sample material on a sampl...
- Patent number 12,105,049
- Issue date Oct 1, 2024
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating a secondary-electron multiplier in the ion dete...
- Patent number 11,581,174
- Issue date Feb 14, 2023
- Sebastian Böhm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Maintaining spectral quality over long measuring periods in imaging...
- Patent number 11,081,328
- Issue date Aug 3, 2021
- Jens Höhndorf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating a secondary-electron multiplier in the ion dete...
- Patent number 11,049,705
- Issue date Jun 29, 2021
- Sebastian Böhm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide-range high mass resolution in reflector time-of-flight mass sp...
- Patent number 10,937,642
- Issue date Mar 2, 2021
- Sebastian Böhm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer with a laser desorption ion source, and laser sys...
- Patent number 10,699,891
- Issue date Jun 30, 2020
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide-range high mass resolution in reflector time-of-flight mass sp...
- Patent number 10,615,022
- Issue date Apr 7, 2020
- Sebastian Böhm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer with laser system for producing photons of differ...
- Patent number 10,236,173
- Issue date Mar 19, 2019
- Jens Bossmeyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Blanking out of pulses in pulsed lasers for LDI mass spectrometers
- Patent number 10,037,878
- Issue date Jul 31, 2018
- Andreas Haase
- G02 - OPTICS
Information Patent Grant
Mass spectrometer with laser spot pattern for MALDI
- Patent number 9,741,550
- Issue date Aug 22, 2017
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser spot control in maldi mass spectrometers
- Patent number 8,872,103
- Issue date Oct 28, 2014
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer with MALDI laser system
- Patent number 8,431,890
- Issue date Apr 30, 2013
- Bruker Daltonik GmbH
- Andreas Haase
- G01 - MEASURING TESTING
Information Patent Grant
Laser system for MALDI mass spectrometry
- Patent number 8,110,795
- Issue date Feb 7, 2012
- Brucker Daltonik GmbH
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for adjusting a sample-ion source electrode di...
- Patent number 7,872,226
- Issue date Jan 18, 2011
- Bruker Daltonik GmbH
- Jens Höhndorf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source using matrix-assisted laser desorption/ionization
- Patent number 7,408,152
- Issue date Aug 5, 2008
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser system for the ionization of a sample by matrix-assisted lase...
- Patent number 7,385,192
- Issue date Jun 10, 2008
- Bruker Daltonik, GmbH
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser system for the ionization of a sample by matrix-assisted lase...
- Patent number 7,235,781
- Issue date Jun 26, 2007
- Bruker Daltonik GmbH
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL
- Publication number 20240355610
- Publication date Oct 24, 2024
- Bruker Daltonics GmbH & Co. KG
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR SPECTROMETRIC ANALYSIS
- Publication number 20240288439
- Publication date Aug 29, 2024
- Bruker Daltonics GmbH & Co. KG
- Tanja BIEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DESORBING AND IONIZING OF SAMPLE MATERIAL
- Publication number 20240177986
- Publication date May 30, 2024
- Bruker Daltonics GmbH & Co. KG
- Marcel NIEHAUS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR DESORPTION SCANNING OF ANALYTE MATERIAL ON A SAMPLE SUPPORT
- Publication number 20230145540
- Publication date May 11, 2023
- Bruker Daltonics GmbH & Co. KG
- Andreas HAASE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR THE ANALYTICAL MEASUREMENT OF SAMPLE MATERIAL ON A SAMPL...
- Publication number 20220397551
- Publication date Dec 15, 2022
- Bruker Daltonics GmbH & Co. KG
- Andreas HAASE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DESORPTION ION SOURCE WITH POST-DESORPTION IONIZATION IN TRANSMISSI...
- Publication number 20220285142
- Publication date Sep 8, 2022
- Bruker Daltonics GmbH & Co. KG
- Andreas HAASE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING A SECONDARY-ELECTRON MULTIPLIER IN THE ION DETE...
- Publication number 20210287891
- Publication date Sep 16, 2021
- Bruker Daltonics GmbH & Co. KG
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAINTAINING SPECTRAL QUALITY OVER LONG MEASURING PERIODS IN IMAGING...
- Publication number 20200258728
- Publication date Aug 13, 2020
- Bruker Daltonik GmbH
- Jens Hohndorf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIDE-RANGE HIGH MASS RESOLUTION IN REFLECTOR TIME-OF-FLIGHT MASS SP...
- Publication number 20200152439
- Publication date May 14, 2020
- Bruker Daltonik GmbH
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING A SECONDARY-ELECTRON MULTIPLIER IN THE ION DETE...
- Publication number 20190304764
- Publication date Oct 3, 2019
- Bruker Daltonik GmbH
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIDE-RANGE HIGH MASS RESOLUTION IN REFLECTOR TIME-OF-FLIGHT MASS SP...
- Publication number 20190096651
- Publication date Mar 28, 2019
- Bruker Daltonik GmbH
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER WITH A LASER DESORPTION ION SOURCE, AND LASER SYS...
- Publication number 20180366311
- Publication date Dec 20, 2018
- Andreas HAASE
- G02 - OPTICS
Information Patent Application
MASS SPECTROMETER WITH LASER SYSTEM FOR PRODUCING PHOTONS OF DIFFER...
- Publication number 20180174815
- Publication date Jun 21, 2018
- Bruker Daltonik GmbH
- Jens BOSSMEYER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BLANKING OUT OF PULSES IN PULSED LASERS FOR LDI MASS SPECTROMETERS
- Publication number 20170076932
- Publication date Mar 16, 2017
- Bruker Daltonik GmbH
- Andreas HAASE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER WITH LASER SPOT PATTERN FOR MALDI
- Publication number 20150122986
- Publication date May 7, 2015
- Bruker Daltonik GmbH
- Andreas HAASE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER WITH MALDI LASER SYSTEM
- Publication number 20130099112
- Publication date Apr 25, 2013
- Bruker Daltonik GmbH
- Andreas Haase
- G01 - MEASURING TESTING
Information Patent Application
LASER SPOT CONTROL IN MALDI MASS SPECTROMETERS
- Publication number 20130056628
- Publication date Mar 7, 2013
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MATRIX-ASSISTED LASER DESORPTION WITH HIGH IONIZATION YIELD
- Publication number 20110139977
- Publication date Jun 16, 2011
- Bruker Daltonik GmbH
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER SYSTEM FOR MALDI MASS SPECTROMETRY
- Publication number 20100224775
- Publication date Sep 9, 2010
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MATRIX-ASSISTED LASER DESORPTION WITH HIGH IONIZATION YIELD
- Publication number 20090039282
- Publication date Feb 12, 2009
- Bruker Daltonik GmbH
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR ADJUSTING A SAMPLE-ION SOURCE ELECTRODE DI...
- Publication number 20080191131
- Publication date Aug 14, 2008
- Bruker Daltonik GmbH
- Jen Hohndorf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Laser systems for the ionization of a sample by matrix-assisted las...
- Publication number 20060186332
- Publication date Aug 24, 2006
- Bruker Daltonik GmbH
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion source using matrix-assisted laser desorption/ionization
- Publication number 20060169914
- Publication date Aug 3, 2006
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Laser system for the ionization of a sample by matrix-assisted lase...
- Publication number 20060071160
- Publication date Apr 6, 2006
- Bruker Daltonik GmbH
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS

Andreas Haase

Person

Patents Grantslast 30 patents

Method for the analytical measurement of sample material on a sampl...

Method of operating a secondary-electron multiplier in the ion dete...

Maintaining spectral quality over long measuring periods in imaging...

Method of operating a secondary-electron multiplier in the ion dete...

Wide-range high mass resolution in reflector time-of-flight mass sp...

Mass spectrometer with a laser desorption ion source, and laser sys...

Wide-range high mass resolution in reflector time-of-flight mass sp...

Mass spectrometer with laser system for producing photons of differ...

Blanking out of pulses in pulsed lasers for LDI mass spectrometers

Mass spectrometer with laser spot pattern for MALDI

Laser spot control in maldi mass spectrometers

Mass spectrometer with MALDI laser system

Laser system for MALDI mass spectrometry

Method and apparatus for adjusting a sample-ion source electrode di...

Ion source using matrix-assisted laser desorption/ionization

Laser system for the ionization of a sample by matrix-assisted lase...

Laser system for the ionization of a sample by matrix-assisted lase...

Patents Applicationslast 30 patents

DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL

METHOD AND DEVICE FOR SPECTROMETRIC ANALYSIS

METHOD FOR DESORBING AND IONIZING OF SAMPLE MATERIAL

DEVICE FOR DESORPTION SCANNING OF ANALYTE MATERIAL ON A SAMPLE SUPPORT

METHOD FOR THE ANALYTICAL MEASUREMENT OF SAMPLE MATERIAL ON A SAMPL...

DESORPTION ION SOURCE WITH POST-DESORPTION IONIZATION IN TRANSMISSI...

METHOD OF OPERATING A SECONDARY-ELECTRON MULTIPLIER IN THE ION DETE...

MAINTAINING SPECTRAL QUALITY OVER LONG MEASURING PERIODS IN IMAGING...

WIDE-RANGE HIGH MASS RESOLUTION IN REFLECTOR TIME-OF-FLIGHT MASS SP...

METHOD OF OPERATING A SECONDARY-ELECTRON MULTIPLIER IN THE ION DETE...

WIDE-RANGE HIGH MASS RESOLUTION IN REFLECTOR TIME-OF-FLIGHT MASS SP...

MASS SPECTROMETER WITH A LASER DESORPTION ION SOURCE, AND LASER SYS...

MASS SPECTROMETER WITH LASER SYSTEM FOR PRODUCING PHOTONS OF DIFFER...

BLANKING OUT OF PULSES IN PULSED LASERS FOR LDI MASS SPECTROMETERS

MASS SPECTROMETER WITH LASER SPOT PATTERN FOR MALDI

MASS SPECTROMETER WITH MALDI LASER SYSTEM

LASER SPOT CONTROL IN MALDI MASS SPECTROMETERS

MATRIX-ASSISTED LASER DESORPTION WITH HIGH IONIZATION YIELD

LASER SYSTEM FOR MALDI MASS SPECTROMETRY

MATRIX-ASSISTED LASER DESORPTION WITH HIGH IONIZATION YIELD

METHOD AND APPARATUS FOR ADJUSTING A SAMPLE-ION SOURCE ELECTRODE DI...

Laser systems for the ionization of a sample by matrix-assisted las...

Ion source using matrix-assisted laser desorption/ionization

Laser system for the ionization of a sample by matrix-assisted lase...