Andreas Kerber

Person

White Plains, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Assessment of HCI in logic circuits based on AC stress in discrete...
- Patent number 10,126,354
- Issue date Nov 13, 2018
- GLOBALFOUNDRIES Inc.
- Andreas Kerber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods, apparatus and system for screening process splits for tech...
- Patent number 10,054,630
- Issue date Aug 21, 2018
- GLOBALFOUNDRIES Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Grant
Methods, apparatus and system for screening process splits for tech...
- Patent number 9,702,926
- Issue date Jul 11, 2017
- GLOBALFOUNDRIES Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Grant
Methods, apparatus and system for voltage ramp testing
- Patent number 9,599,656
- Issue date Mar 21, 2017
- GLOBALFOUNDRIES Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Grant
Gate dielectric protection for transistors
- Patent number 9,324,822
- Issue date Apr 26, 2016
- GLOBALFOUNDRIES Inc.
- Andreas Kerber
- G01 - MEASURING TESTING
Information Patent Grant
Devices having bias temperature instability compensation
- Patent number 8,817,570
- Issue date Aug 26, 2014
- GLOBALFOUNDRIES, INC.
- William McMahon
- G11 - INFORMATION STORAGE
Information Patent Grant
Techniques for the fabrication of thick gate dielectric
- Patent number 8,778,750
- Issue date Jul 15, 2014
- International Business Machines Corporation
- Eduard Albert Cartier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit decoupling capacitor arrangement
- Patent number 8,610,188
- Issue date Dec 17, 2013
- GLOBALFOUNDRIES, INC.
- Andreas Kerber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor circuit including a long channel device and a short c...
- Patent number 7,880,236
- Issue date Feb 1, 2011
- Advanced Micro Devices, Inc.
- Andreas Kerber
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS, APPARATUS AND SYSTEM FOR SCREENING PROCESS SPLITS FOR TECH...
- Publication number 20170292986
- Publication date Oct 12, 2017
- GLOBALFOUNDRIES, Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Application
GATE DIELECTRIC PROTECTION FOR TRANSISTORS
- Publication number 20160204098
- Publication date Jul 14, 2016
- GLOBALFOUNDRIES INC.
- Andreas Kerber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS, APPARATUS AND SYSTEM FOR VOLTAGE RAMP TESTING
- Publication number 20160146879
- Publication date May 26, 2016
- GLOBAL FOUNDRIES Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Application
GATE DIELECTRIC PROTECTION FOR TRANSISTORS
- Publication number 20160005828
- Publication date Jan 7, 2016
- GLOBALFOUNDRIES INC.
- Andreas Kerber
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INLINE DEVICE CHARACTERIZATION AND TEMPERA...
- Publication number 20150377956
- Publication date Dec 31, 2015
- GLOBALFOUNDRIES INC.
- William MCMAHON
- G01 - MEASURING TESTING
Information Patent Application
METHODS, APPARATUS AND SYSTEM FOR SCREENING PROCESS SPLITS FOR TECH...
- Publication number 20150346271
- Publication date Dec 3, 2015
- GLOBALFOUNDRIES INC.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DECOUPLING CAPACITOR ARRANGEMENT
- Publication number 20140110772
- Publication date Apr 24, 2014
- GLOBALFOUNDRIES, Inc.
- Andreas Kerber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Techniques for the Fabrication of Thick Gate Dielectric
- Publication number 20130292778
- Publication date Nov 7, 2013
- International Business Machines Corporation
- Eduard Albert Cartier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICES HAVING BIAS TEMPERATURE INSTABILITY COMPENSATION
- Publication number 20130208555
- Publication date Aug 15, 2013
- GLOBALFOUNDRIES INC.
- William McMahon
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT DECOUPLING CAPACITOR ARRANGEMENT
- Publication number 20130069131
- Publication date Mar 21, 2013
- Andreas Kerber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR RELIABILITY TESTING OF SEMICONDUCTOR DEVICES
- Publication number 20130033285
- Publication date Feb 7, 2013
- GLOBALFOUNDRIES INC.
- William McMahon
- G01 - MEASURING TESTING
Information Patent Application
SOI SUBSTRATES AND DEVICES ON SOI SUBSTRATES HAVING A SILICON NITRI...
- Publication number 20100038686
- Publication date Feb 18, 2010
- Advanced Micro Devices, Inc.
- Kingsuk MAITRA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR CIRCUIT INCLUDING A LONG CHANNEL DEVICE AND A SHORT C...
- Publication number 20100019313
- Publication date Jan 28, 2010
- Advanced Micro Devices, Inc.
- Andreas KERBER
- H01 - BASIC ELECTRIC ELEMENTS

Andreas Kerber

Person

Patents Grantslast 30 patents

Assessment of HCI in logic circuits based on AC stress in discrete...

Methods, apparatus and system for screening process splits for tech...

Methods, apparatus and system for screening process splits for tech...

Methods, apparatus and system for voltage ramp testing

Gate dielectric protection for transistors

Devices having bias temperature instability compensation

Techniques for the fabrication of thick gate dielectric

Integrated circuit decoupling capacitor arrangement

Semiconductor circuit including a long channel device and a short c...

Patents Applicationslast 30 patents

METHODS, APPARATUS AND SYSTEM FOR SCREENING PROCESS SPLITS FOR TECH...

GATE DIELECTRIC PROTECTION FOR TRANSISTORS

METHODS, APPARATUS AND SYSTEM FOR VOLTAGE RAMP TESTING

GATE DIELECTRIC PROTECTION FOR TRANSISTORS

METHOD AND APPARATUS FOR INLINE DEVICE CHARACTERIZATION AND TEMPERA...

METHODS, APPARATUS AND SYSTEM FOR SCREENING PROCESS SPLITS FOR TECH...

INTEGRATED CIRCUIT DECOUPLING CAPACITOR ARRANGEMENT

Techniques for the Fabrication of Thick Gate Dielectric

DEVICES HAVING BIAS TEMPERATURE INSTABILITY COMPENSATION

INTEGRATED CIRCUIT DECOUPLING CAPACITOR ARRANGEMENT

METHODS FOR RELIABILITY TESTING OF SEMICONDUCTOR DEVICES

SOI SUBSTRATES AND DEVICES ON SOI SUBSTRATES HAVING A SILICON NITRI...

SEMICONDUCTOR CIRCUIT INCLUDING A LONG CHANNEL DEVICE AND A SHORT C...