Andreas Kittlaus

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Bad Liebenwerda OT Theisa, DE

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Patents Grantslast 30 patents

Information Patent Grant
Probe station for testing semiconductor substrates and comprising E...
- Patent number 8,278,951
- Issue date Oct 2, 2012
- Cascade Microtech, Inc.
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Probe support with shield for the examination of test substrates un...
- Patent number 7,652,491
- Issue date Jan 26, 2010
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE SUPPORT AND PROCESS FOR THE EXAMINATION OF TEST SUBSTRATES UN...
- Publication number 20080116917
- Publication date May 22, 2008
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION TO TESTING SEMICONDUCTOR SUBSTRATES AND COMPRISING EM...
- Publication number 20080116918
- Publication date May 22, 2008
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING