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Andreas MADER
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Trebur, DE
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Patents Grants
last 30 patents
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Patent Grant
Method and X-ray inspection system, in particular for non-destructi...
Patent number
10,338,269
Issue date
Jul 2, 2019
Pia Dreiseitel
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for detecting a particular material in an obje...
Patent number
9,128,200
Issue date
Sep 8, 2015
Smiths Heimann GmbH
Matthias Muenster
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD AND X-RAY INSPECTION SYSTEM, IN PARTICULAR FOR NON-DESTRUCTI...
Publication number
20160334535
Publication date
Nov 17, 2016
Smiths Heimann GmbH
Pia Dreiseitel
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR DETECTING A PARTICULAR MATERIAL IN AN OBJE...
Publication number
20110091013
Publication date
Apr 21, 2011
Matthias MUENSTER
G01 - MEASURING TESTING