Membership
Tour
Register
Log in
Andreas Norbert Wiswesser
Follow
Person
Freiberg, DE
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method of making and apparatus having polishing pad with window
Patent number
7,547,243
Issue date
Jun 16, 2009
Applied Materials, Inc.
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Grant
Polishing pad with window
Patent number
7,264,536
Issue date
Sep 4, 2007
Applied Materials, Inc.
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Grant
Method for monitoring a substrate during chemical mechanical polishing
Patent number
7,018,271
Issue date
Mar 28, 2006
Applied Materials Inc.
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Grant
Method and apparatus for determining polishing endpoint with multip...
Patent number
6,986,699
Issue date
Jan 17, 2006
Applied Materials, Inc.
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Grant
Method and apparatus for detecting an end-point in chemical mechani...
Patent number
6,913,511
Issue date
Jul 5, 2005
Applied Materials, Inc.
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Grant
Method and apparatus for measuring substrate layer thickness during...
Patent number
6,764,380
Issue date
Jul 20, 2004
Applied Materials Inc.
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Grant
Method and apparatus for optical monitoring in chemical mechanical...
Patent number
6,659,842
Issue date
Dec 9, 2003
Applied Materials Inc.
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Grant
Method and apparatus for detecting an end-point in chemical mechani...
Patent number
6,652,355
Issue date
Nov 25, 2003
Applied Materials, Inc.
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Grant
Endpoint detection with light beams of different wavelengths
Patent number
6,607,422
Issue date
Aug 19, 2003
Applied Materials, Inc.
Boguslaw Swedek
B24 - GRINDING POLISHING
Information
Patent Grant
Method and apparatus for measuring substrate layer thickness during...
Patent number
6,524,165
Issue date
Feb 25, 2003
Applied Materials, Inc.
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Grant
Method and apparatus for measuring substrate layer thickness during...
Patent number
6,494,766
Issue date
Dec 17, 2002
Applied Materials, Inc.
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Grant
Method and apparatus for optical monitoring in chemical mechanical...
Patent number
6,296,548
Issue date
Oct 2, 2001
Applied Materials, Inc.
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Grant
Method and apparatus for detecting an end-point in chemical mechani...
Patent number
6,280,289
Issue date
Aug 28, 2001
Applied Materials, Inc.
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Grant
Method and apparatus for determining substrate layer thickness duri...
Patent number
6,247,998
Issue date
Jun 19, 2001
Applied Materials, Inc.
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Grant
Endpoint detection with light beams of different wavelengths
Patent number
6,190,234
Issue date
Feb 20, 2001
Applied Materials, Inc.
Boguslaw Swedek
B24 - GRINDING POLISHING
Information
Patent Grant
Method and apparatus for measuring substrate layer thickness during...
Patent number
6,159,073
Issue date
Dec 12, 2000
Applied Materials, Inc.
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF MAKING AND APPARATUS HAVING POLISHING PAD WITH WINDOW
Publication number
20070281587
Publication date
Dec 6, 2007
Applied Materials, Inc.
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Application
Endpoint system for electro-chemical mechanical polishing
Publication number
20050173259
Publication date
Aug 11, 2005
APPLIED MATERIALS, INC.
Rashid Mavliev
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Method for monitoring a substrate during chemical mechanical polishing
Publication number
20040242123
Publication date
Dec 2, 2004
APPLIED MATERIALS, INC.
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Application
Method and apparatus for detecting an end-point in chemical mechani...
Publication number
20040116047
Publication date
Jun 17, 2004
Applied Materials, Inc., a Delaware corporation
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Application
Polishing pad with window
Publication number
20040082271
Publication date
Apr 29, 2004
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Application
Endpoint detection with multiple light beams
Publication number
20040058621
Publication date
Mar 25, 2004
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Application
Method and apparatus for measuring substrate layer thickness during...
Publication number
20030104761
Publication date
Jun 5, 2003
Applied Materials, Inc., a Delaware corporation
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING
Information
Patent Application
Method and apparatus for optical monitoring in chemical mechanical...
Publication number
20020013120
Publication date
Jan 31, 2002
Applied Materials, a Delaware corporation
Andreas Norbert Wiswesser
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for detecting an end-point in chemical mechani...
Publication number
20010036793
Publication date
Nov 1, 2001
Applied Materials, Inc., a Delaware corporation
Andreas Norbert Wiswesser
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for determining polishing endpoint with multip...
Publication number
20010027080
Publication date
Oct 4, 2001
Applied Materials, Inc., Delaware corporation
Andreas Norbert Wiswesser
B24 - GRINDING POLISHING