Andreas Orth

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Dresden, DE

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Patents Grantslast 30 patents

Information Patent Grant
Methods for forming an integrated circuit, including openings in a...
- Patent number 7,776,759
- Issue date Aug 17, 2010
- Qimonda AG
- Peter Lahnor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining the depth of a buried structure
- Patent number 7,307,735
- Issue date Dec 11, 2007
- Infineon Technologies AG
- Thomas Hecht
- G01 - MEASURING TESTING
Information Patent Grant
Memory cell and method for fabricating it
- Patent number 7,144,770
- Issue date Dec 5, 2006
- Infineon Technologies AG
- Albert Birner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating trench capacitors for integrated semiconduct...
- Patent number 7,087,484
- Issue date Aug 8, 2006
- Infineon Technologies AG
- Matthias Goldbach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor trench structure
- Patent number 6,919,255
- Issue date Jul 19, 2005
- Infineon Technologies AG
- Albert Birner
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR FORMING AN INTEGRATED CIRCUIT, INCLUDING OPENINGS IN A...
- Publication number 20070286945
- Publication date Dec 13, 2007
- QIMONDA AG
- Peter Lahnor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Memory and method for fabricating it
- Publication number 20060275981
- Publication date Dec 7, 2006
- Infineon Technologies AG
- Alejandro Avellan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Memory cell and method for fabricating it
- Publication number 20050158945
- Publication date Jul 21, 2005
- Albert Birner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for fabricating trench capacitors for integrated semiconduct...
- Publication number 20050118775
- Publication date Jun 2, 2005
- Matthias Goldbach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for determining the depth of a buried structure
- Publication number 20050003642
- Publication date Jan 6, 2005
- Infineon Technologies AG
- Thomas Hecht
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor trench structure
- Publication number 20040126961
- Publication date Jul 1, 2004
- Albert Birner
- H01 - BASIC ELECTRIC ELEMENTS