Andreas Pfeiffer

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Marzling, DE

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for detecting defects in wafer manufacturing
- Patent number 8,532,364
- Issue date Sep 10, 2013
- Texas Instruments Deutschland GmbH
- Alexander Urban
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR DETECTING DEFECTS IN WAFER MANUFACTURING
- Publication number 20100208980
- Publication date Aug 19, 2010
- Texas Instruments Deutschland GmbH
- Alexander Urban
- G01 - MEASURING TESTING