Andreas ROELOFS

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Wheaton, IL, US

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Patents Grantslast 30 patents

Information Patent Grant
Charge gradient microscopy
- Patent number 9,885,861
- Issue date Feb 6, 2018
- UChicago Argonne, LLC
- Andreas Roelofs
- G02 - OPTICS
Information Patent Grant
Methods for top-down fabrication of wafer scale TMDC monolayers
- Patent number 9,809,903
- Issue date Nov 7, 2017
- UChicago Argonne, LLC
- Saptarshi Das
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
All 2D, high mobility, flexible, transparent thin film transistor
- Patent number 9,548,394
- Issue date Jan 17, 2017
- UChicago Argonne, LLC
- Saptarshi Das
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spatially resolved imaging of opto-electrical property variations
- Patent number 8,836,944
- Issue date Sep 16, 2014
- UChicago Argonne, LLC
- Maxim Nikiforov
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR TOP-DOWN FABRICATION OF WAFER SCALE TMDC MO...
- Publication number 20170253996
- Publication date Sep 7, 2017
- UChicago Argonne, LLC
- Saptarshi Das
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
CHARGE GRADIENT MICROSCOPY
- Publication number 20150301324
- Publication date Oct 22, 2015
- UChicago Argonne, LLC
- Andreas Roelofs
- G02 - OPTICS
Information Patent Application
ALL 2D, HIGH MOBILITY, FLEXIBLE, TRANSPARENT THIN FILM TRANSISTOR
- Publication number 20150303315
- Publication date Oct 22, 2015
- UChicago Argonne, LLC
- Saptarshi Das
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPATIALLY RESOLVED IMAGING OF OPTO-ELECTRICAL PROPERTY VARIATIONS
- Publication number 20140085638
- Publication date Mar 27, 2014
- Maxim NIKIFOROV
- G01 - MEASURING TESTING