Andreas Schaaf

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Mittenaar-Bicken, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for determining positions of structures on a mask
- Patent number 8,248,618
- Issue date Aug 21, 2012
- Vistec Semiconductor Systems GmbH
- Klaus Rinn
- G01 - MEASURING TESTING
Information Patent Grant
Method for reproducibly determining geometrical and/or optical obje...
- Patent number 7,939,789
- Issue date May 10, 2011
- Vistec Semiconductor Systems GmbH
- Michael Heiden
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for improving the reproducibility of a coordinate measuring...
- Patent number 7,654,007
- Issue date Feb 2, 2010
- Vistec Semiconductor Systems GmbH
- Michael Heiden
- G01 - MEASURING TESTING
Information Patent Grant
Method for enhancing the measuring accuracy when determining the co...
- Patent number 7,528,960
- Issue date May 5, 2009
- Vistec Semiconductor Systems GmbH
- Artur Boesser
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for Determining Positions of Structures on a Mask
- Publication number 20100220339
- Publication date Sep 2, 2010
- Vistec Semiconductor Systems GmbH
- Klaus Rinn
- G01 - MEASURING TESTING
Information Patent Application
Method for reproducibly determining object characteristics
- Publication number 20090045318
- Publication date Feb 19, 2009
- Vistec Semiconductor Systems GmbH
- Michael Heiden
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method for improving the reproducibility of a coordinate measuring...
- Publication number 20080295348
- Publication date Dec 4, 2008
- Vistec Semiconductor Systems GmbH
- Michael Heiden
- G01 - MEASURING TESTING
Information Patent Application
Method for enhancing the measuring accuracy when determining the co...
- Publication number 20070268496
- Publication date Nov 22, 2007
- Vistec Semiconductor Systems GmbH
- Artur Boesser
- G01 - MEASURING TESTING