Membership
Tour
Register
Log in
Andreas Schertel
Follow
Person
Aalen, DE
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Examining, analyzing and/or processing an object using an object re...
Patent number
11,721,518
Issue date
Aug 8, 2023
Carl Zeiss Microscopy GmbH
Andreas Schertel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
FIB-SEM array tomography
Patent number
9,464,995
Issue date
Oct 11, 2016
Carl Zeiss Microscopy GmbH
Martin Edelmann
G01 - MEASURING TESTING
Information
Patent Grant
Particle beam device and method for processing and/or analyzing a s...
Patent number
9,455,120
Issue date
Sep 27, 2016
Carl Zeiss Microscopy GmbH
Andreas Schertel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle beam device and method for processing and/or analyzing a s...
Patent number
9,275,832
Issue date
Mar 1, 2016
Carl Zeiss Microscopy GmbH
Andreas Schertel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle beam device and method for use in a particle beam device
Patent number
8,487,270
Issue date
Jul 16, 2013
Carl Zeiss Microscopy GmbH
Ulrike Zeile
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle beam device and method for use in a particle beam device
Patent number
8,247,785
Issue date
Aug 21, 2012
Carl Zeiss NTS GmbH
Ulrike Zeile
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Fastening an object to a manipulator and/or to an object holder in...
Publication number
20240038484
Publication date
Feb 1, 2024
CARL ZEISS MICROSCOPY GMBH
Andreas Schertel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
EXAMINING, ANALYZING AND/OR PROCESSING AN OBJECT USING AN OBJECT RE...
Publication number
20230326707
Publication date
Oct 12, 2023
CARL ZEISS MICROSCOPY GMBH
Andreas Schertel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
EXAMINING, ANALYZING AND/OR PROCESSING AN OBJECT USING AN OBJECT RE...
Publication number
20210241992
Publication date
Aug 5, 2021
CARL ZEISS MICROSCOPY GMBH
Andreas Schertel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FIB-SEM ARRAY TOMOGRAPHY
Publication number
20150036122
Publication date
Feb 5, 2015
CARL ZEISS MICROSCOPY GMBH
Martin Edelmann
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE BEAM DEVICE AND METHOD FOR USE IN A PARTICLE BEAM DEVICE
Publication number
20120305765
Publication date
Dec 6, 2012
Ulrike Zeile
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PARTICLE BEAM DEVICE AND METHOD FOR PROCESSING AND/OR ANALYZING A S...
Publication number
20120205538
Publication date
Aug 16, 2012
Andreas SCHERTEL
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR GENERATING THREE-DIMENSIONAL IMAGE DATA
Publication number
20120112063
Publication date
May 10, 2012
Andreas Schertel
G01 - MEASURING TESTING
Information
Patent Application
Particle beam device and method for use in a particle beam device
Publication number
20090014648
Publication date
Jan 15, 2009
Ulrike Zeile
H01 - BASIC ELECTRIC ELEMENTS