Andreas Schmaunz

Person

Oberkochen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Operating a gas feed device for a particle beam apparatus
- Patent number 12,002,656
- Issue date Jun 4, 2024
- Carl Zeiss Microscopy GmbH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Setting position of a particle beam device component
- Patent number 11,837,434
- Issue date Dec 5, 2023
- Carl Zeiss Microscopy GmbH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Operating a gas supply device for a particle beam device
- Patent number 11,764,036
- Issue date Sep 19, 2023
- Carl Zeiss Microscopy GmbH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Examining, analyzing and/or processing an object using an object re...
- Patent number 11,721,518
- Issue date Aug 8, 2023
- Carl Zeiss Microscopy GmbH
- Andreas Schertel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for changing the spatial orientation of a micro-sample in a...
- Patent number 11,355,310
- Issue date Jun 7, 2022
- Carl Zeiss Microscopy GmbH
- Holger Doemer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Operating a particle beam apparatus and/or a light microscope
- Patent number 11,347,043
- Issue date May 31, 2022
- Carl Zeiss Microscopy GmbH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Operating a particle beam device
- Patent number 11,158,485
- Issue date Oct 26, 2021
- Carl Zeiss Microscopy GmbH
- Andreas Schmaunz
- G01 - MEASURING TESTING
Information Patent Grant
Method of recording an image using a particle microscope and partic...
- Patent number 10,839,491
- Issue date Nov 17, 2020
- Carl Zeiss Microscopy GmbH
- Luyang Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for the in situ preparation of microscopic specimens
- Patent number 10,347,461
- Issue date Jul 9, 2019
- Carl Zeiss Microscopy GmbH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Object preparation device and particle beam device with an object p...
- Patent number 10,319,561
- Issue date Jun 11, 2019
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and devices for charge compensation
- Patent number 10,115,558
- Issue date Oct 30, 2018
- Carl Zeiss Microscopy GmbH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring a distance of a component from an object and f...
- Patent number 9,496,116
- Issue date Nov 15, 2016
- Carl Zeiss Microscopy GmbH
- Holger Doemer
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR IMAGING WITH A SCANNING ELECTRON MICROSCOPE AND SCANNING...
- Publication number 20240290574
- Publication date Aug 29, 2024
- Carl Zeiss SMT GMBH
- Daniel Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING A PARTICLE BEAM SYSTEM AND RELATED SYSTEM AND C...
- Publication number 20240047175
- Publication date Feb 8, 2024
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PROCESSING A SAMPLE, PARTICLE BEAM SYSTEM, AND COMPUTER P...
- Publication number 20240029996
- Publication date Jan 25, 2024
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPERATING A GAS SUPPLY DEVICE FOR A PARTICLE BEAM DEVICE
- Publication number 20230420224
- Publication date Dec 28, 2023
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EXAMINING, ANALYZING AND/OR PROCESSING AN OBJECT USING AN OBJECT RE...
- Publication number 20230326707
- Publication date Oct 12, 2023
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schertel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS RESERVOIR, GAS SUPPLY DEVICE HAVING A GAS RESERVOIR, AND PARTIC...
- Publication number 20230282442
- Publication date Sep 7, 2023
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS SUPPLY DEVICE, SYSTEM HAVING A GAS SUPPLY DEVICE, AND PARTICLE...
- Publication number 20230241650
- Publication date Aug 3, 2023
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- B08 - CLEANING
Information Patent Application
GAS SUPPLY DEVICE, PARTICLE BEAM APPARATUS HAVING A GAS SUPPLY DEVI...
- Publication number 20230215688
- Publication date Jul 6, 2023
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ABLATING MATERIAL FOR AN OBJECT IN A PARTICLE BEAM DEVICE
- Publication number 20220130639
- Publication date Apr 28, 2022
- CARL ZEISS MICROSCOPY GMBH
- Holger Doemer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CHANGING THE SPATIAL ORIENTATION OF A MICRO-SAMPLE IN A...
- Publication number 20210296087
- Publication date Sep 23, 2021
- CARL ZEISS MICROSCOPY GMBH
- Holger Doemer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A PARTICLE BEAM DEVICE AND / OR A LIGHT MICROS...
- Publication number 20210271063
- Publication date Sep 2, 2021
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EXAMINING, ANALYZING AND/OR PROCESSING AN OBJECT USING AN OBJECT RE...
- Publication number 20210241992
- Publication date Aug 5, 2021
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schertel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A PARTICLE BEAM DEVICE AND PARTICLE BEAM DEVIC...
- Publication number 20200388463
- Publication date Dec 10, 2020
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- G01 - MEASURING TESTING
Information Patent Application
OPERATING A GAS SUPPLY DEVICE FOR A PARTICLE BEAM DEVICE
- Publication number 20200335309
- Publication date Oct 22, 2020
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SETTING A POSITION OF A COMPONENT OF A PARTICLE BEAM DEV...
- Publication number 20200144024
- Publication date May 7, 2020
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBJECT PREPARATION DEVICE AND PARTICLE BEAM DEVICE WITH AN OBJECT P...
- Publication number 20190103249
- Publication date Apr 4, 2019
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR THE IN SITU PREPARATOIN OF MICROSCOPIC SPECIMENS
- Publication number 20190019650
- Publication date Jan 17, 2019
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF RECORDING AN IMAGE USING A PARTICLE MICROSCOPE AND PARTIC...
- Publication number 20190019274
- Publication date Jan 17, 2019
- CARL ZEISS MICROSCOPY GMBH
- Luyang Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND DEVICES FOR CHARGE COMPENSATION
- Publication number 20160260574
- Publication date Sep 8, 2016
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MEASURING A DISTANCE OF A COMPONENT FROM AN OBJECT AND F...
- Publication number 20160118216
- Publication date Apr 28, 2016
- CARL ZEISS MICROSCOPY GMBH
- Holger Doemer
- H01 - BASIC ELECTRIC ELEMENTS

Andreas Schmaunz

Person

Patents Grantslast 30 patents

Operating a gas feed device for a particle beam apparatus

Setting position of a particle beam device component

Operating a gas supply device for a particle beam device

Examining, analyzing and/or processing an object using an object re...

Method for changing the spatial orientation of a micro-sample in a...

Operating a particle beam apparatus and/or a light microscope

Operating a particle beam device

Method of recording an image using a particle microscope and partic...

Method for the in situ preparation of microscopic specimens

Object preparation device and particle beam device with an object p...

Methods and devices for charge compensation

Method for measuring a distance of a component from an object and f...

Patents Applicationslast 30 patents

METHOD FOR IMAGING WITH A SCANNING ELECTRON MICROSCOPE AND SCANNING...

METHOD OF OPERATING A PARTICLE BEAM SYSTEM AND RELATED SYSTEM AND C...

METHOD OF PROCESSING A SAMPLE, PARTICLE BEAM SYSTEM, AND COMPUTER P...

OPERATING A GAS SUPPLY DEVICE FOR A PARTICLE BEAM DEVICE

EXAMINING, ANALYZING AND/OR PROCESSING AN OBJECT USING AN OBJECT RE...

GAS RESERVOIR, GAS SUPPLY DEVICE HAVING A GAS RESERVOIR, AND PARTIC...

GAS SUPPLY DEVICE, SYSTEM HAVING A GAS SUPPLY DEVICE, AND PARTICLE...

GAS SUPPLY DEVICE, PARTICLE BEAM APPARATUS HAVING A GAS SUPPLY DEVI...

ABLATING MATERIAL FOR AN OBJECT IN A PARTICLE BEAM DEVICE

METHOD FOR CHANGING THE SPATIAL ORIENTATION OF A MICRO-SAMPLE IN A...

METHOD FOR OPERATING A PARTICLE BEAM DEVICE AND / OR A LIGHT MICROS...

EXAMINING, ANALYZING AND/OR PROCESSING AN OBJECT USING AN OBJECT RE...

METHOD FOR OPERATING A PARTICLE BEAM DEVICE AND PARTICLE BEAM DEVIC...

OPERATING A GAS SUPPLY DEVICE FOR A PARTICLE BEAM DEVICE

METHOD FOR SETTING A POSITION OF A COMPONENT OF A PARTICLE BEAM DEV...

OBJECT PREPARATION DEVICE AND PARTICLE BEAM DEVICE WITH AN OBJECT P...

METHOD FOR THE IN SITU PREPARATOIN OF MICROSCOPIC SPECIMENS

METHOD OF RECORDING AN IMAGE USING A PARTICLE MICROSCOPE AND PARTIC...

METHODS AND DEVICES FOR CHARGE COMPENSATION

METHOD FOR MEASURING A DISTANCE OF A COMPONENT FROM AN OBJECT AND F...