Membership
Tour
Register
Log in
Andreas Schönle
Follow
Person
Gottingen, DE
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
High spatial resolution imaging of a structure of interest in a spe...
Patent number
8,174,692
Issue date
May 8, 2012
Max-Planck Gesellschaft zur Foerderung der Wissenschaften e.V.
Stefan W. Hell
G01 - MEASURING TESTING
Information
Patent Grant
High spatial resolution imaging of a structure of interest in a spe...
Patent number
8,084,754
Issue date
Dec 27, 2011
Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
Stefan Hell
G01 - MEASURING TESTING
Information
Patent Grant
High spatial resolution imaging of a structure of interest in a spe...
Patent number
7,880,150
Issue date
Feb 1, 2011
Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
Stefan Hell
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHODS AND DEVICE FOR DETECTING SINGLE PHOTONS FROM A SAMPLE COMPR...
Publication number
20240280488
Publication date
Aug 22, 2024
Abberior Instruments GmbH
Andreas SCHONLE
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR DETERMINING POSITIONS OF MOLECULES IN A SAMPLE
Publication number
20230204514
Publication date
Jun 29, 2023
Gerald DONNERT
G01 - MEASURING TESTING
Information
Patent Application
HIGH SPATIAL RESOLUTION IMAGING OF A STRUCTURE OF INTEREST IN A SPE...
Publication number
20110160083
Publication date
Jun 30, 2011
Stefan Hell
G02 - OPTICS
Information
Patent Application
High Spatial Resolution Imaging of a Structure of Interest in a Spe...
Publication number
20110081653
Publication date
Apr 7, 2011
Max-Planck-Gesellschaft zur Forderung der Wissenschaftern e.V.
Stefan W. HELL
G02 - OPTICS
Information
Patent Application
METHOD OF DETERMINING A MEASUREMENT VALUE ON THE BASIS OF SINGLE MO...
Publication number
20100140506
Publication date
Jun 10, 2010
Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V.
Christian EGGELING
G01 - MEASURING TESTING
Information
Patent Application
High spatial resolution imaging of a structure of interest in a spe...
Publication number
20090134342
Publication date
May 28, 2009
Stefan Hell
G02 - OPTICS