Andreas Schoenle

Person

Goettingen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Bandpass filter for light having variable lower and upper cut-off w...
- Patent number 11,947,097
- Issue date Apr 2, 2024
- ABBERIOR INSTRUMENTS GMBH
- Joachim Fischer
- G02 - OPTICS
Information Patent Grant
Method, device and laser scanning microscope for generating rasteri...
- Patent number 10,795,140
- Issue date Oct 6, 2020
- ABBERIOR INSTRUMENTS GMBH
- Andreas Schoenle
- G01 - MEASURING TESTING
Information Patent Grant
Methods of high-resolution imaging a structure of a sample, the str...
- Patent number 10,488,342
- Issue date Nov 26, 2019
- ABBERIOR INSTRUMENTS GMBH
- Andreas Schoenle
- G01 - MEASURING TESTING
Information Patent Grant
Methods of high-resolution imaging a structure of a sample, the str...
- Patent number 10,429,305
- Issue date Oct 1, 2019
- ABBERIOR INSTRUMENTS GMBH
- Andreas Schoenle
- G02 - OPTICS
Information Patent Grant
Device for separately modulating the wave fronts of two components...
- Patent number 9,632,297
- Issue date Apr 25, 2017
- ABBERIOR INSTRUMENTS GMBH
- Matthias Reuss
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
METHOD, LIGHT MICROSCOPE, AND COMPUTER PROGRAM FOR LOCALIZING OR TR...
- Publication number 20240094128
- Publication date Mar 21, 2024
- Abberior Instruments GmbH
- Roman SCHMIDT
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND LIGHT MICROSCOPE FOR LOCALIZING INDIVIDUAL EMITTERS IN A...
- Publication number 20240045190
- Publication date Feb 8, 2024
- Abberior Instruments GmbH
- Roman SCHMIDT
- G02 - OPTICS
Information Patent Application
METHOD, DEVICE AND NON-TRANSITORY COMPUTER-READABLE MEDIUM FOR LOCA...
- Publication number 20240046595
- Publication date Feb 8, 2024
- Abberior Instruments GmbH
- Roman SCHMIDT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BANDPASS FILTER FOR LIGHT HAVING VARIABLE LOWER AND UPPER CUT-OFF W...
- Publication number 20210223528
- Publication date Jul 22, 2021
- Abberior Instruments GmbH
- Joachim Fischer
- G02 - OPTICS
Information Patent Application
METHODS OF HIGH-RESOLUTION IMAGING A STRUCTURE OF A SAMPLE, THE STR...
- Publication number 20190056327
- Publication date Feb 21, 2019
- Abberior Instruments GmbH
- Andreas Schoenle
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF HIGH-RESOLUTION IMAGING A STRUCTURE OF A SAMPLE, THE STR...
- Publication number 20180238804
- Publication date Aug 23, 2018
- Abberior Instruments GmbH
- Andreas Schoenle
- G02 - OPTICS
Information Patent Application
Method, Device and Laser Scanning Microscope for Generating Rasteri...
- Publication number 20170248778
- Publication date Aug 31, 2017
- Abberior Instruments GmbH
- Andreas Schoenle
- G02 - OPTICS
Information Patent Application
DEVICE FOR SEPARATELY MODULATING THE WAVE FRONTS OF TWO COMPONENTS...
- Publication number 20170123197
- Publication date May 4, 2017
- Abberior Instruments GmbH
- Matthias Reuss
- G02 - OPTICS

Andreas Schoenle

Person

Patents Grantslast 30 patents

Bandpass filter for light having variable lower and upper cut-off w...

Method, device and laser scanning microscope for generating rasteri...

Methods of high-resolution imaging a structure of a sample, the str...

Methods of high-resolution imaging a structure of a sample, the str...

Device for separately modulating the wave fronts of two components...

Patents Applicationslast 30 patents

METHOD, LIGHT MICROSCOPE, AND COMPUTER PROGRAM FOR LOCALIZING OR TR...

METHOD AND LIGHT MICROSCOPE FOR LOCALIZING INDIVIDUAL EMITTERS IN A...

METHOD, DEVICE AND NON-TRANSITORY COMPUTER-READABLE MEDIUM FOR LOCA...

BANDPASS FILTER FOR LIGHT HAVING VARIABLE LOWER AND UPPER CUT-OFF W...

METHODS OF HIGH-RESOLUTION IMAGING A STRUCTURE OF A SAMPLE, THE STR...

METHODS OF HIGH-RESOLUTION IMAGING A STRUCTURE OF A SAMPLE, THE STR...

Method, Device and Laser Scanning Microscope for Generating Rasteri...

DEVICE FOR SEPARATELY MODULATING THE WAVE FRONTS OF TWO COMPONENTS...