Andreas Tschmelitsch

Follow

Person

Villach, AT

People

Patents Grantslast 30 patents

Information Patent Grant
Method for detecting damage to a semiconductor chip
- Patent number 9,378,317
- Issue date Jun 28, 2016
- Infineon Technologies AG
- Andreas Tschmelitsch
- G01 - MEASURING TESTING
Information Patent Grant
Detection circuit and method for detecting damage to a semiconducto...
- Patent number 8,575,723
- Issue date Nov 5, 2013
- Infineon Technologies AG
- Andreas Tschmelitsch
- G01 - MEASURING TESTING
Information Patent Grant
Current control using thermally matched resistors
- Patent number 8,129,789
- Issue date Mar 6, 2012
- Infineon Technologies AG
- Alexander Mayer
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Device with Damage Detection Circuit and Method for P...
- Publication number 20140040853
- Publication date Feb 6, 2014
- INFINEON TECHNOLOGIES AG
- Andreas Tschmelitsch
- G01 - MEASURING TESTING
Information Patent Application
Current Control Using Thermally Matched Resistors
- Publication number 20110291741
- Publication date Dec 1, 2011
- Alexander Mayer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device With Damage Detection Circuit and Method for P...
- Publication number 20080035923
- Publication date Feb 14, 2008
- INFINEON TECHNOLOGIES AG
- Andreas Tschmelitsch
- G06 - COMPUTING CALCULATING COUNTING