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Andreas Ulrich
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Munich, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Device for spectroscopy using charged analytes
Patent number
7,385,210
Issue date
Jun 10, 2008
Technische Universitaet Muenchen
Andreas Ulrich
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam irradiation of gases and light source using the same
Patent number
6,282,222
Issue date
Aug 28, 2001
Rutgers, The State University
Jochen Wieser
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron beam irradiation of gases and light source using the same
Patent number
6,052,401
Issue date
Apr 18, 2000
Rutgers, The State University
Jochen Wieser
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Device for spectroscopy using charged analytes
Publication number
20070023637
Publication date
Feb 1, 2007
Andreas Ulrich
G01 - MEASURING TESTING
Information
Patent Application
Automatic analysis of the properties of a system based on runtime logs
Publication number
20040153871
Publication date
Aug 5, 2004
Andrej Pietschker
H04 - ELECTRIC COMMUNICATION TECHNIQUE