Andrei Tkachuk

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Walnut Creek, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Verification of integrated circuits against malicious circuit inser...
- Patent number 8,139,846
- Issue date Mar 20, 2012
- University of Southern California
- Michael A. Bajura
- G01 - MEASURING TESTING
Information Patent Grant
Process for examining mineral samples with X-ray microscope and pro...
- Patent number 8,068,579
- Issue date Nov 29, 2011
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
X-ray microscope with switchable x-ray source
- Patent number 7,813,475
- Issue date Oct 12, 2010
- Xradia, Inc.
- Ziyu Wu
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Mechanism for switching sources in x-ray microscope
- Patent number 7,796,725
- Issue date Sep 14, 2010
- Xradia, Inc.
- Ziyu Wu
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Structured anode X-ray source for X-ray microscopy
- Patent number 7,443,953
- Issue date Oct 28, 2008
- Xradia, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
VERIFICATION OF INTEGRATED CIRCUITS AGAINST MALICIOUS CIRCUIT INSER...
- Publication number 20110002528
- Publication date Jan 6, 2011
- University of Southern California
- Michael A. Bajura
- G06 - COMPUTING CALCULATING COUNTING