Andrew Alexander McKnight

Follow

Person

Bronxville, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device defect type determination method and structure
- Patent number 7,781,239
- Issue date Aug 24, 2010
- International Business Machines Corporation
- Ishtiaq Ahsan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE DEFECT TYPE DETERMINATION METHOD AND STRUCTURE
- Publication number 20090179661
- Publication date Jul 16, 2009
- International Business Machines Corporation
- Ishtiaq Ahsan
- G01 - MEASURING TESTING