Membership
Tour
Register
Log in
Andrew D. Cutler
Follow
Person
Yorktown, VA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Spatially-and temporally-resolved multi-parameter interferometric r...
Patent number
8,976,351
Issue date
Mar 10, 2015
The United States of America as Represented by NASA
Daniel Bivolaru
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SPATIALLY-AND TEMPORALLY-RESOLVED MULTI-PARAMETER INTERFEROMETRIC R...
Publication number
20130141721
Publication date
Jun 6, 2013
U.S.A. as represented by the Administrator of the National Aeronautics and Sp...
Daniel Bivolaru
G01 - MEASURING TESTING