Andrew David Laver Humphris

Person

Bristol, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning probe system
- Patent number 11,959,936
- Issue date Apr 16, 2024
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Method of imaging a surface using a scanning probe microscope
- Patent number 11,733,265
- Issue date Aug 22, 2023
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe system
- Patent number 10,969,404
- Issue date Apr 6, 2021
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,928,418
- Issue date Feb 23, 2021
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe system
- Patent number 10,585,114
- Issue date Mar 10, 2020
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe system
- Patent number 10,401,381
- Issue date Sep 3, 2019
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Probe calibration or measurement routine
- Patent number 10,254,306
- Issue date Apr 9, 2019
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system
- Patent number 10,107,834
- Issue date Oct 23, 2018
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe system with multiple probes
- Patent number 9,939,460
- Issue date Apr 10, 2018
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Probe actuation system with feedback controller
- Patent number 9,921,240
- Issue date Mar 20, 2018
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Probe system with multiple actuation locations
- Patent number 9,874,582
- Issue date Jan 23, 2018
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Probe and sample exchange mechanism
- Patent number 9,784,760
- Issue date Oct 10, 2017
- INFINITESIMA LIMITED
- Andrew Humphris
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multiple probe detection and actuation
- Patent number 9,739,798
- Issue date Aug 22, 2017
- INFINITESIMA LIMITED
- Andrew Humphris
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe microscope with probe movement from heating
- Patent number 9,599,636
- Issue date Mar 21, 2017
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive mode scanning probe microscope
- Patent number 9,557,347
- Issue date Jan 31, 2017
- INFINITESIMA LIMITED
- Andrew Humphris
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Photothermal actuation of a probe for scanning probe microscopy
- Patent number 9,410,982
- Issue date Aug 9, 2016
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Multiple probe actuation
- Patent number 9,389,243
- Issue date Jul 12, 2016
- INFINITESIMA LIMITED
- Andrew Humphris
- G11 - INFORMATION STORAGE
Information Patent Grant
Multiple probe actuation
- Patent number 9,304,144
- Issue date Apr 5, 2016
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Probe actuation
- Patent number 9,291,641
- Issue date Mar 22, 2016
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Beam scanning system
- Patent number 9,222,958
- Issue date Dec 29, 2015
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Method of investigating a sample surface
- Patent number 9,134,340
- Issue date Sep 15, 2015
- INFINITESIMA LIMITED
- Andrew Humphris
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe assembly for a scanning probe microscope
- Patent number 9,052,340
- Issue date Jun 9, 2015
- INFINITESIMA LTD
- Andrew Humphris
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe assembly for a scanning probe microscope
- Patent number 8,910,311
- Issue date Dec 9, 2014
- Infinitesima Ltd.
- Andrew Humphris
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Control system for a scanning probe microscope
- Patent number 8,732,861
- Issue date May 20, 2014
- Infinitesima Ltd.
- Andrew Humphris
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe detection system
- Patent number 8,528,110
- Issue date Sep 3, 2013
- Infinitesima Ltd.
- Andrew Humphris
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Dynamic probe detection system
- Patent number 8,479,310
- Issue date Jul 2, 2013
- Infinitesima Ltd.
- Andrew Humphris
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Control system for scanning probe microscope
- Patent number 8,296,856
- Issue date Oct 23, 2012
- Infinitesima Ltd.
- Andrew Humphris
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Vibration compensation in probe microscopy
- Patent number 8,220,066
- Issue date Jul 10, 2012
- Infinitesima Ltd.
- Andrew Humphris
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR SCANNING A SAMPLE WITH A PROBE
- Publication number 20240426869
- Publication date Dec 26, 2024
- INFINITESIMA LIMITED
- Andrew David Laver Humphris
- G01 - MEASURING TESTING
Information Patent Application
LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE
- Publication number 20240369595
- Publication date Nov 7, 2024
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
NEURAL NETWORK TRAINING METHOD
- Publication number 20240096081
- Publication date Mar 21, 2024
- INFINITESIMA LIMITED
- Andrew Humphris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE
- Publication number 20230030991
- Publication date Feb 2, 2023
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE SYSTEM
- Publication number 20220390484
- Publication date Dec 8, 2022
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20200141970
- Publication date May 7, 2020
- INFINITESIMA LIMITED
- Andrew HUMPHRIS
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe System
- Publication number 20200041540
- Publication date Feb 6, 2020
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE SYSTEM
- Publication number 20200011893
- Publication date Jan 9, 2020
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM
- Publication number 20180267081
- Publication date Sep 20, 2018
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE SYSTEM WITH TWO PROVE DRIVERS
- Publication number 20180164342
- Publication date Jun 14, 2018
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe System with Multiple Probes
- Publication number 20170356931
- Publication date Dec 14, 2017
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
PROBE ACTUATION SYSTEM WITH FEEDBACK CONTROLLER
- Publication number 20170074901
- Publication date Mar 16, 2017
- INFINITESIMA LIMITED
- Andrew HUMPHRIS
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM WITH MULTIPLE ACTUATION LOCATIONS
- Publication number 20170016932
- Publication date Jan 19, 2017
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
PROBE AND SAMPLE EXCHANGE MECHANISM
- Publication number 20160187376
- Publication date Jun 30, 2016
- INFINITESIMA LIMITED
- Andrew HUMPHRIS
- G01 - MEASURING TESTING
Information Patent Application
PROBE MICROSCOPE
- Publication number 20160154022
- Publication date Jun 2, 2016
- Andrew HUMPHRIS
- G01 - MEASURING TESTING
Information Patent Application
PROBE CALIBRATION OR MEASUREMENT ROUTINE
- Publication number 20150301079
- Publication date Oct 22, 2015
- Infinitesima Limited
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE PROBE ACTUATION
- Publication number 20150285836
- Publication date Oct 8, 2015
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE PROBE DETECTION AND ACTUATION
- Publication number 20150219686
- Publication date Aug 6, 2015
- Infinitesima Limited
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE PROBE ACTUATION
- Publication number 20150219685
- Publication date Aug 6, 2015
- Infinitesima Limited
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
PHOTOTHERMAL ACTUATION OF A PROBE FOR SCANNING PROBE MICROSCOPY
- Publication number 20150219684
- Publication date Aug 6, 2015
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
BEAM SCANNING SYSTEM
- Publication number 20150020244
- Publication date Jan 15, 2015
- Infinitesima Limited
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
PROBE ACTUATION
- Publication number 20150013035
- Publication date Jan 8, 2015
- INIFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
ADAPTIVE MODE SCANNING PROBE MICROSCOPE
- Publication number 20140026263
- Publication date Jan 23, 2014
- Infinitesima Limited
- Andrew Humphris
- B82 - NANO-TECHNOLOGY
Information Patent Application
CONTROL SYSTEM FOR A SCANNING PROBE MICROSCOPE
- Publication number 20130042375
- Publication date Feb 14, 2013
- INFINITESIMA LTD
- Andrew Humphris
- B82 - NANO-TECHNOLOGY
Information Patent Application
PROBE ASSEMBLY FOR A SCANNING PROBE MICROSCOPE
- Publication number 20130014296
- Publication date Jan 10, 2013
- INFINITESIMA LTD
- Andrew Humphris
- B82 - NANO-TECHNOLOGY
Information Patent Application
CONTROL SYSTEM FOR SCANNING PROBE MICROSCOPE
- Publication number 20110296561
- Publication date Dec 1, 2011
- INFINITESIMA LTD
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC PROBE DETECTION SYSTEM
- Publication number 20110247106
- Publication date Oct 6, 2011
- INFINITESIMA LTD
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
PROBE DETECTION SYSTEM
- Publication number 20110167525
- Publication date Jul 7, 2011
- INFINITESIMA LTD
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PROBE ALIGNMENT
- Publication number 20110138506
- Publication date Jun 9, 2011
- INFINITESIMA LTD
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION COMPENSATION IN PROBE MICROSCOPY
- Publication number 20100235955
- Publication date Sep 16, 2010
- INFINITESIMA LTD
- Andrew Humphris
- G01 - MEASURING TESTING

Andrew David Laver Humphris

Person

Patents Grantslast 30 patents

Scanning probe system

Method of imaging a surface using a scanning probe microscope

Scanning probe system

Scanning probe microscope

Scanning probe system

Scanning probe system

Probe calibration or measurement routine

Measurement system

Scanning probe system with multiple probes

Probe actuation system with feedback controller

Probe system with multiple actuation locations

Probe and sample exchange mechanism

Multiple probe detection and actuation

Probe microscope with probe movement from heating

Adaptive mode scanning probe microscope

Photothermal actuation of a probe for scanning probe microscopy

Multiple probe actuation

Multiple probe actuation

Probe actuation

Beam scanning system

Method of investigating a sample surface

Probe assembly for a scanning probe microscope

Probe assembly for a scanning probe microscope

Control system for a scanning probe microscope

Probe detection system

Dynamic probe detection system

Control system for scanning probe microscope

Vibration compensation in probe microscopy

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR SCANNING A SAMPLE WITH A PROBE

LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE

NEURAL NETWORK TRAINING METHOD

METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE

SCANNING PROBE SYSTEM

SCANNING PROBE MICROSCOPE

Scanning Probe System

SCANNING PROBE SYSTEM

MEASUREMENT SYSTEM

SCANNING PROBE SYSTEM WITH TWO PROVE DRIVERS

Scanning Probe System with Multiple Probes

PROBE ACTUATION SYSTEM WITH FEEDBACK CONTROLLER

PROBE SYSTEM WITH MULTIPLE ACTUATION LOCATIONS

PROBE AND SAMPLE EXCHANGE MECHANISM

PROBE MICROSCOPE

PROBE CALIBRATION OR MEASUREMENT ROUTINE

MULTIPLE PROBE ACTUATION

MULTIPLE PROBE DETECTION AND ACTUATION

MULTIPLE PROBE ACTUATION

PHOTOTHERMAL ACTUATION OF A PROBE FOR SCANNING PROBE MICROSCOPY

BEAM SCANNING SYSTEM

PROBE ACTUATION

ADAPTIVE MODE SCANNING PROBE MICROSCOPE

CONTROL SYSTEM FOR A SCANNING PROBE MICROSCOPE

PROBE ASSEMBLY FOR A SCANNING PROBE MICROSCOPE

CONTROL SYSTEM FOR SCANNING PROBE MICROSCOPE

DYNAMIC PROBE DETECTION SYSTEM

PROBE DETECTION SYSTEM

METHOD OF PROBE ALIGNMENT

VIBRATION COMPENSATION IN PROBE MICROSCOPY