Andrew Ferko

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Waterbury, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for automatically generating test patterns for at...
- Patent number 8,209,141
- Issue date Jun 26, 2012
- International Business Machines Corporation
- Robert W. Bassett
- G01 - MEASURING TESTING
Information Patent Grant
System and method for digital logic testing
- Patent number 7,900,112
- Issue date Mar 1, 2011
- International Business Machines Corporation
- Kenneth Pichamuthu
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for reducing test data volume in the testing of l...
- Patent number 7,103,816
- Issue date Sep 5, 2006
- Cadence Design Systems, Inc.
- Frank O. Distler
- G01 - MEASURING TESTING
Information Patent Grant
System for reducing test data volume in the testing of logic products
- Patent number 6,782,501
- Issue date Aug 24, 2004
- Cadence Design Systems, Inc.
- Frank O. Distler
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR AUTOMATICALLY GENERATING TEST PATTERNS FOR AT...
- Publication number 20100235136
- Publication date Sep 16, 2010
- International Business Machines Corporation
- Robert W. Bassett
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DIGITAL LOGIC TESTING
- Publication number 20100017668
- Publication date Jan 21, 2010
- Kenneth Pichamuthu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for reducing test data volume in the testing of l...
- Publication number 20020099991
- Publication date Jul 25, 2002
- International Business Machines Corporation
- Frank O. Distler
- G01 - MEASURING TESTING
Information Patent Application
System for reducing test data volume in the testing of logic products
- Publication number 20020099992
- Publication date Jul 25, 2002
- International Business Machines Corporation
- Frank O. Distler
- G01 - MEASURING TESTING