ANDREW HOFF

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TAMPA, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
Noncontact determination of interface trap density for semiconducto...
- Patent number 9,041,417
- Issue date May 26, 2015
- University of South Florida
- Elena I. Oborina
- G01 - MEASURING TESTING
Information Patent Grant
Noncontact determination of interface trap density for semiconducto...
- Patent number 8,803,533
- Issue date Aug 12, 2014
- University of South Florida
- Elena I. Oborina
- G01 - MEASURING TESTING
Information Patent Grant
Method for making silicon containing dielectric films
- Patent number 6,967,176
- Issue date Nov 22, 2005
- University of South Florida
- Andrew M. Hoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement of the mobile ion concentration in the oxide layer of a...
- Patent number 5,773,989
- Issue date Jun 30, 1998
- University of South Florida
- Piotr Edelman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NONCONTACT DETERMINATION OF INTERFACE TRAP DENSITY FOR SEMICONDUCTO...
- Publication number 20140132286
- Publication date May 15, 2014
- University of South Florida
- ELENA I. OBORINA
- G01 - MEASURING TESTING
Information Patent Application
NONCONTACT DETERMINATION OF INTERFACE TRAP DENSITY FOR SEMICONDUCTO...
- Publication number 20120176146
- Publication date Jul 12, 2012
- University of South Florida
- ELENA I. OBORINA
- G01 - MEASURING TESTING