Andrew J. Banchieri

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Newark, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
X-ray technique-based nonintrusive inspection apparatus
- Patent number 7,409,039
- Issue date Aug 5, 2008
- GE Homeland Protection, Inc.
- Andrew J. Banchieri
- G01 - MEASURING TESTING
Information Patent Grant
X-ray technique-based nonintrusive inspection apparatus having an a...
- Patent number 6,891,919
- Issue date May 10, 2005
- InVision Technologies, Inc.
- David E. Kresse
- G01 - MEASURING TESTING
Information Patent Grant
X-ray technique-based nonintrusive inspection apparatus
- Patent number 6,859,518
- Issue date Feb 22, 2005
- InVision Technologies, Inc.
- Andrew J. Banchieri
- G01 - MEASURING TESTING
Information Patent Grant
Nonintrusive x-ray-based luggage scanner
- Patent number D474706
- Issue date May 20, 2003
- InVision Technologies, Inc.
- David E. Kresse
- D10 - Measuring, testing, or signalling instruments

Patents Applicationslast 30 patents

Information Patent Application
X-ray technique-based nonintrusive inspection apparatus
- Publication number 20050013405
- Publication date Jan 20, 2005
- Andrew J. Banchieri
- G01 - MEASURING TESTING
Information Patent Application
X-ray technique-based nonintrusive inspection apparatus
- Publication number 20040096030
- Publication date May 20, 2004
- Andrew J. Banchieri
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TECHNIQUE-BASED NONINTRUSIVE INSPECTION APPARATUS HAVING AN A...
- Publication number 20040081274
- Publication date Apr 29, 2004
- David E. Kresse
- G01 - MEASURING TESTING
Information Patent Application
X-ray collimator and a method of making an x-ray collimator
- Publication number 20040052332
- Publication date Mar 18, 2004
- Andrew J. Banchieri
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING